{"created":"2023-05-15T11:59:45.876320+00:00","id":6345,"links":{},"metadata":{"_buckets":{"deposit":"14adfdf0-24ea-4a70-b5ae-05f812e87817"},"_deposit":{"created_by":3,"id":"6345","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6345"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006345","sets":["15:20"]},"author_link":["26350","26231","26351","26349","26354","26355","26353"],"item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-09-25","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2008 International Conference on Solid State Devices and Materials (SSDM2008)"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes an analysis of oscillation conditions in CMOS ring oscillators composed of even-stage inverters. A design method optimizing the oscillator's operational margin based on this analysis is also described. We have found that stable oscillation margin analysis for this type of circuit is basically equivalent to the Static Noise Margin (SNM) analysis for SRAM write/read operations. Using this concept, we have established a design method that determines the optimal circuit design parameters to ensure stable oscillation.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2008 International Conference on Solid State Devices and Materials (SSDM 2008), September 23-26, 2008, Tsukuba, Ibaraki, Japan","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference 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Kawazu, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Fukuoka Industry, Science and Technology Foundation"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8064"}]},"item_23_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Nakamura, Kazuyuki","creatorNameLang":"en"},{"creatorName":"中村, 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