{"created":"2023-05-15T11:59:46.502794+00:00","id":6360,"links":{},"metadata":{"_buckets":{"deposit":"ce307139-f296-409e-85c3-a00cc02d12b1"},"_deposit":{"created_by":3,"id":"6360","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6360"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006360","sets":["8:24"]},"author_link":["1143","26481","1147","26483","26484","26485"],"control_number":"6360","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1050283687642122880","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-05-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"1686","bibliographicPageStart":"1679","bibliographicVolumeNumber":"E89-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1093/ietisy/e89-d.5.1679","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2006 The Institute of Electronics, Information and Communication Engineers"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA10826272","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1745-1361","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10029813"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8076"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAlternatives":[{"creatorAlternative":"Yamashita, Y.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Yamashita, Yoshiyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAlternatives":[{"creatorAlternative":"Wang, L.-T.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Wang, Laung-Terng","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{"creatorAlternative":"Saluja, K. K.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Saluja, Kewal K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{"creatorAlternative":"Kinoshita, K.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Kinoshita, Kozo","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-28"}],"displaytype":"detail","filename":"10029813.pdf","filesize":[{"value":"836.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10029813.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6360/files/10029813.pdf"},"version_id":"ad4c2623-6a23-47bd-bedf-b57acfc3233d"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"scan testing","subitem_subject_scheme":"Other"},{"subitem_subject":"capture power","subitem_subject_scheme":"Other"},{"subitem_subject":"X-bit","subitem_subject_scheme":"Other"},{"subitem_subject":"IR-drop","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A New Method for Low-Capture-Power Test Generation for Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A New Method for Low-Capture-Power Test Generation for Scan Testing","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-01-28"},"publish_date":"2020-01-28","publish_status":"0","recid":"6360","relation_version_is_last":true,"title":["A New Method for Low-Capture-Power Test Generation for Scan Testing"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-01-29T01:14:37.497772+00:00"}