{"created":"2023-05-15T11:59:46.546938+00:00","id":6361,"links":{},"metadata":{"_buckets":{"deposit":"d44bd4d6-6468-4f2b-b4ce-d2c1a4597729"},"_deposit":{"created_by":3,"id":"6361","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6361"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006361","sets":["8:24"]},"author_link":["26497","26493","1147","26505","26504","6567","26496","26503","1143","26500","26498"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"330","bibliographicPageStart":"319","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"Journal of Low Power Electronics"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The occurrence of high switching activity when the response to a test vector is captured by flipflops in scan testing may cause excessive IR drop, resulting in significant test-induced yield loss. This paper addresses the problem with a novel method based on test set modification, featuring (1) a new constrained X-identification technique that turns a properly selected set of bits in a fullyspecified test set into X-bits without fault coverage loss, and (2) a new LCP (low capture power) X-filling technique that optimally assigns 0’s and 1’s to the X-bits for the purpose of reducing the switching activity of the resulting test set in capture mode. This method can be readily applied in any test generation flow for capture power reduction without any impact on area, timing, test set size, and fault coverage.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26500","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Suzuki,  T."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Miyase","familyNameLang":"en"},{"familyName":"宮瀬","familyNameLang":"ja"},{"familyName":"ミヤセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Kohei","givenNameLang":"en"},{"givenName":"紘平","givenNameLang":"ja"},{"givenName":"コウヘイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"6567","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30452824","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030452824"},{"nameIdentifier":"6507979281","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=6507979281"},{"nameIdentifier":"219","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/219_ja.html"}],"names":[{"name":"Miyase, Kohei","nameLang":"en"},{"name":"宮瀬, 紘平","nameLang":"ja"},{"name":"ミヤセ, コウヘイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26503","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Minamoto,  Y."}]},{"nameIdentifiers":[{"nameIdentifier":"26504","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26505","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja,  K. K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Scientific Publishers"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1166/jolpe.2005.042","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://doi.org/10.1166/jolpe.2005.042"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1166/jolpe.2005.042","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2005 American Scientific Publishers"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12015350","subitem_source_identifier_type":"NCID"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10029814"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Department of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Department of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Innovation Plaza Fukuoka, Japan Science and Technology Agency, Fukuoka 814-0001, Japan"},{"subitem_text_value":"Innovation Plaza Fukuoka, Japan Science and Technology Agency, Fukuoka 814-0001, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Dept. of ECE, University of Wisconsin - Madison, Madison, WI 53706, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8078"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki,  Tatsuya"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Minamoto,  Yoshihiro"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-28"}],"displaytype":"detail","filename":"10029814.pdf","filesize":[{"value":"430.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10029814.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6361/files/10029814.pdf"},"version_id":"026e6d78-f40f-4823-be6f-1ed04381112b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Low Capture Power","subitem_subject_scheme":"Other"},{"subitem_subject":"X-Identification","subitem_subject_scheme":"Other"},{"subitem_subject":"X-Filling","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Efficient Test Set Modification for Capture Power Reduction","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Efficient Test Set Modification for Capture Power Reduction"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-28"},"publish_date":"2020-01-28","publish_status":"0","recid":"6361","relation_version_is_last":true,"title":["Efficient Test Set Modification for Capture Power Reduction"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:54.606554+00:00"}