{"created":"2023-05-15T11:59:46.589223+00:00","id":6362,"links":{},"metadata":{"_buckets":{"deposit":"2fd819c2-ef4f-445e-97c1-bd1c16766d43"},"_deposit":{"created_by":3,"id":"6362","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6362"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006362","sets":["8:24"]},"author_link":["26511","26516","1147","26509","26512","26510","26517","6567","26518","26519","1143"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-09-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicPageEnd":"1405","bibliographicPageStart":"1398","bibliographicVolumeNumber":"E90-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems "}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High power dissipation can occur when the response to a test vector is captured by flip-flops in scan testing, resulting in excessive IR drop, which may cause significant capture-induced yield loss in the DSM era. This paper addresses this serious problem with a novel test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. Compared with previous methods that passively conduct X-filling for unspecified bits in test cubes generated only for fault detection, the new method achieves more capture power reduction with less test set inflation. Experimental results show its effectiveness.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Miyase","familyNameLang":"en"},{"familyName":"宮瀬","familyNameLang":"ja"},{"familyName":"ミヤセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Kohei","givenNameLang":"en"},{"givenName":"紘平","givenNameLang":"ja"},{"givenName":"コウヘイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"6567","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30452824","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030452824"},{"nameIdentifier":"6507979281","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=6507979281"},{"nameIdentifier":"219","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/219_ja.html"}],"names":[{"name":"Miyase, Kohei","nameLang":"en"},{"name":"宮瀬, 紘平","nameLang":"ja"},{"name":"ミヤセ, コウヘイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26516","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Suzuki,  T."}]},{"nameIdentifiers":[{"nameIdentifier":"26517","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja,  K. K."}]},{"nameIdentifiers":[{"nameIdentifier":"26518","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26519","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kinoshita,  K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1093/ietisy/e90-d.9.1398","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2007 The Institute of Electronics, Information and Communication Engineers"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10826272","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10029822"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502 Japan"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502 Japan"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502 Japan"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502 Japan"},{"subitem_text_value":"Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI 53706, U.S.A."},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria, Suite 11, Sunnyvale, CA 94086, U.S.A."},{"subitem_text_value":"Faculty of Informatics, Osaka Gakuin University, Suita-shi, 564-8511 Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8079"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki,  Tatsuya"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita,  Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-28"}],"displaytype":"detail","filename":"10029822.pdf","filesize":[{"value":"1.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10029822.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6362/files/10029822.pdf"},"version_id":"72477dd9-8e6a-4ebf-b65d-9b4361f374eb"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"scan testing","subitem_subject_scheme":"Other"},{"subitem_subject":"capture power","subitem_subject_scheme":"Other"},{"subitem_subject":"X-bit","subitem_subject_scheme":"Other"},{"subitem_subject":"IR-drop","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Novel ATPG Method for Capture Power Reduction During Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Novel ATPG Method for Capture Power Reduction During Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-28"},"publish_date":"2020-01-28","publish_status":"0","recid":"6362","relation_version_is_last":true,"title":["A Novel ATPG Method for Capture Power Reduction During Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:55.262265+00:00"}