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アイテム
Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time
http://hdl.handle.net/10228/00007573
http://hdl.handle.net/10228/000075733da9f2d1-226e-4b57-bd9f-3033e3094a8f
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10029815.pdf (4.0 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-01-28 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Hu, Yu
× Hu, Yu× Han, Yinhe× Li, Xiaowei× Li, Huawei× 温, 暁青 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | LSI testing is critical to guarantee chips are fault-free before they are integrated in a system, so as to increase the reliability of the system. Although full-scan is a widely adopted design-for-testability technique for LSI design and testing, there is a strong need to reduce the test data Volume, scan-in Power dissipation, and test application Time (VPT) of full-scan testing. Based on the analysis of the characteristics of the variable-to-fixed run-length coding technique and the random access scan architecture, this paper presents a novel design scheme to tackle all VPT issues simultaneously. Experimental results on ISCAS'89 benchmarks have shown on average 51.2%, 99.5%, 99.3%, and 85.5% reduction effects in test data volume, average scan-in power dissipation, peak scan-in power dissipation, and test application time, respectively. | |||||
| 言語 | en | |||||
| 書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E89-D, 号 10, p. 2616-2625, 発行日 2006-10-01 |
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| 出版社 | ||||||
| 出版者 | 電子情報通信学会 | |||||
| 言語 | ja | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1093/ietisy/e89-d.10.2616 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 548 | |||||
| NCID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA10826272 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 0916-8532 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | EISSN | |||||
| 収録物識別子 | 1745-1361 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2006 The Institute of Electronics, Information and Communication Engineers | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | compression | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | run-length coding | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | random access scan | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | power dissipation | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | test application time | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10029815 | |||||
| 連携ID | ||||||
| 値 | 8080 | |||||
