{"created":"2023-05-15T11:59:46.966524+00:00","id":6371,"links":{},"metadata":{"_buckets":{"deposit":"09893e60-41da-4268-ac0d-6b597dd75bf5"},"_deposit":{"created_by":3,"id":"6371","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6371"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006371","sets":["8:24"]},"author_link":["26562","26552","1147","26556","26560","26555","26554","26558","26561","1143","26559"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"On low-capture-power test generation for scan testing"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"270","bibliographicPageStart":"265","bibliographic_titles":[{"bibliographic_title":"23rd IEEE VLSI Test Symposium (VTS'05)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Research on low-power scan testing has been focused on the shift mode, with little or no consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR drop, resulting in significant yield loss. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified (X) bits in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes are obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"23rd IEEE VLSI Test Symposium (VTS'05), 1-5 May 2005, Palm Springs, California, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26558","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yamashita,  Y."}]},{"nameIdentifiers":[{"nameIdentifier":"26559","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kajiihara,  S."}]},{"nameIdentifiers":[{"nameIdentifier":"26560","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26561","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja,  K. K."}]},{"nameIdentifiers":[{"nameIdentifier":"26562","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kinoshita,  K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/VTS.2005.60","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/VTS.2005.60"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/VTS.2005.60","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7695-2314-5","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1093-0167","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2375-1053","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056656"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Dept. of ECE, 1415 Engineering Drive, University of Wisconsin-Madison, Madison, WI 53706, USA"},{"subitem_text_value":"Faculty of Informatics, Osaka Gakuin University, Suita 564-8511, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8089"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yamashita,  Yoshiyuki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita,  Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-30"}],"displaytype":"detail","filename":"10056656.pdf","filesize":[{"value":"138.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056656.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6371/files/10056656.pdf"},"version_id":"ac83f66b-48a5-4340-a9a6-cb7c92de3bea"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Power dissipation","subitem_subject_scheme":"Other"},{"subitem_subject":"Flip-flops","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Sequential analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic test pattern generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Integrated circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit faults","subitem_subject_scheme":"Other"},{"subitem_subject":"Sequential circuits","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic testing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On Low-Capture-Power Test Generation for Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Low-Capture-Power Test Generation for Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-30"},"publish_date":"2020-01-30","publish_status":"0","recid":"6371","relation_version_is_last":true,"title":["On Low-Capture-Power Test Generation for Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:58.666228+00:00"}