{"created":"2023-05-15T11:59:47.009573+00:00","id":6372,"links":{},"metadata":{"_buckets":{"deposit":"dc8596ff-b496-4c97-bc93-a8c86b97ddfa"},"_deposit":{"created_by":3,"id":"6372","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6372"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006372","sets":["8:24"]},"author_link":["26574","1147","26567","26570","6567","26575","26568","26576","26569","26578","1143","26577","26566"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"A new ATPG method for efficient capture power reduction during scan testing"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-05-15","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"63","bibliographicPageStart":"58","bibliographic_titles":[{"bibliographic_title":"24th IEEE VLSI Test Symposium"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High power dissipation can occur when the response to a test vector is captured by flip-flops in scan testing, resulting in excessive JR drop, which may cause significant capture-induced yield loss in the DSM era. This paper addresses this serious problem with a novel test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. Compared with previous methods that passively conduct X-filling for unspecified bits in test cubes generated only for fault detection, the new method achieves more capture power reduction with less test set inflation. Experimental results show its effectiveness","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"24th IEEE VLSI Test Symposium (VTS'06), 30 April-4 May 2006, Berkeley, CA, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Miyase","familyNameLang":"en"},{"familyName":"宮瀬","familyNameLang":"ja"},{"familyName":"ミヤセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Kohei","givenNameLang":"en"},{"givenName":"紘平","givenNameLang":"ja"},{"givenName":"コウヘイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"6567","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30452824","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030452824"},{"nameIdentifier":"6507979281","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=6507979281"},{"nameIdentifier":"219","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/219_ja.html"}],"names":[{"name":"Miyase, Kohei","nameLang":"en"},{"name":"宮瀬, 紘平","nameLang":"ja"},{"name":"ミヤセ, コウヘイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26574","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Suzuki,  T."}]},{"nameIdentifiers":[{"nameIdentifier":"26575","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja,  K. K."}]},{"nameIdentifiers":[{"nameIdentifier":"26576","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26577","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Abdel-Hafez,  K. S."}]},{"nameIdentifiers":[{"nameIdentifier":"26578","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kinoshita,  K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/VTS.2006.8","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/VTS.2006.8"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/VTS.2006.8","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7695-2514-8","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1093-0167","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2375-1053","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056666"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Innovation Plaza Fukuoka, Japan Science and Technology Agency, Fukuoka 814-0001, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of ECE, University of Wisconsin-Madison, Madison, WI 53706, USA"},{"subitem_text_value":"SynTest Technologies,Sunnyvale, CA 94086, USA"},{"subitem_text_value":"SynTest Technologies,Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Faculty of Informatics, Osaka Gakuin University, Suita 564-8511, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8090"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki,  Tatsuya"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Abdel-Hafez,  Khader S."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita,  Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-30"}],"displaytype":"detail","filename":"10056666.pdf","filesize":[{"value":"282.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056666.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6372/files/10056666.pdf"},"version_id":"a310a9c6-e926-44b7-8869-28d3afe9b144"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Automatic test pattern generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Power dissipation","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Sequential analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Power generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Sequential circuits","subitem_subject_scheme":"Other"},{"subitem_subject":"Clocks","subitem_subject_scheme":"Other"},{"subitem_subject":"Flip-flops","subitem_subject_scheme":"Other"},{"subitem_subject":"Integrated circuit testing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A New ATPG Method for Efficient Capture Power Reduction During Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A New ATPG Method for Efficient Capture Power Reduction During Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-30"},"publish_date":"2020-01-30","publish_status":"0","recid":"6372","relation_version_is_last":true,"title":["A New ATPG Method for Efficient Capture Power Reduction During Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:55.482502+00:00"}