{"created":"2023-05-15T11:59:47.137693+00:00","id":6375,"links":{},"metadata":{"_buckets":{"deposit":"9d9940cd-c539-424b-9d2c-ed534a762fb3"},"_deposit":{"created_by":3,"id":"6375","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6375"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006375","sets":["8:24"]},"author_link":["26588","1143","26087","6567","1147","26593","26594","26595","26596"],"control_number":"6375","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-03-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"108","bibliographicPageStart":"103","bibliographic_titles":[{"bibliographic_title":"2015 IEEE 24th Asian Test Symposium (ATS)","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"IR-drop induced by launch switching activity (LSA) in capture mode during at-speed scan testing increases delay along not only logic paths (LPs) but also clock paths (Cps). Excessive extra delay along LPs compromises test yields due to false capture failures, while excessive extra delay along CPs compromises test quality due to test clock stretch. This paper is the first to mitigate the impact of LSA on both LPs and CPs with a novel LCPA (Logic/Clock Path-Aware) at-speed scan test generation scheme, featuring (1) a new metric for assessing the risk of false capture failures based on the amount of LSA around both LPs and CPs, (2) a procedure for avoiding false capture failures by reducing LSA around LPs or masking uncertain test responses, and (3) a procedure for reducing test clock stretch by reducing LSA around CPs. Experimental results demonstrate the effectiveness of the LCPA scheme in improving test yields and test quality.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2015 IEEE 24th Asian Test Symposium (ATS), 22-25 November 2015, Mumbai, India","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_text":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html","subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2015.25","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4673-9739-1","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID(連携)","attribute_value_mlt":[{"subitem_text_value":"10286851"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8096"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Asada, 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