@inproceedings{oai:kyutech.repo.nii.ac.jp:00006376,
 author = {Wen, Xiaoqing and 温, 暁青 and Yamato,  Yuta and Miyase, Kohei and 宮瀬, 紘平 and Kajihara, Seiji and 梶原, 誠司 and Furukawa,  Hiroshi and Wang,  Laung-Terng and Saluja,  Kewal K. and Kinoshita,  Kozo},
 book = {7th Workshop on RTL and High Level Testing (WRTLT`06)},
 month = {Nov},
 note = {Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of nondeterministic logic behavior. However, the extensive use of vias and the unpredictable order relation among threshold voltages at fanout branches, both being typical phenomena in a deep-submicron circuit, have not been fully addressed by conventional per-test X-fault diagnosis. To solve these problems, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and (2) occurrence probabilities of logic behavior for a physical defect to handle the unpredictable relation among threshold voltages. Experimental result show the effectiveness of the proposed method., 7th Workshop on RTL and High Level Testing (WRTLT`06), November 23-24, 2006, Fukuoka, Japan},
 pages = {55--60},
 publisher = {WRTLT`06},
 title = {An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits},
 year = {2006},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}