{"created":"2023-05-15T11:59:47.180642+00:00","id":6376,"links":{},"metadata":{"_buckets":{"deposit":"19701aea-3d57-4d14-9cea-ad54e79d16dd"},"_deposit":{"created_by":3,"id":"6376","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6376"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006376","sets":["15:20"]},"author_link":["26598","1147","26603","26607","26608","26644","26609","26610","26611","26602","6567","26606","26601","26605","1143","26604"],"item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-11-23","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60","bibliographicPageStart":"55","bibliographic_titles":[{"bibliographic_title":"7th Workshop on RTL and High Level Testing (WRTLT`06)"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of nondeterministic logic behavior. However, the extensive use of vias and the unpredictable order relation among threshold voltages at fanout branches, both being typical phenomena in a deep-submicron circuit, have not been fully addressed by conventional per-test X-fault diagnosis. To solve these problems, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and (2) occurrence probabilities of logic behavior for a physical defect to handle the unpredictable relation among threshold voltages. Experimental result show the effectiveness of the proposed method.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"7th Workshop on RTL and High Level Testing (WRTLT`06), November 23-24, 2006, Fukuoka, Japan","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26605","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wen, X."}]},{"nameIdentifiers":[{"nameIdentifier":"26606","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yamato, Y."}]},{"nameIdentifiers":[{"nameIdentifier":"26607","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Miyase, K."}]},{"nameIdentifiers":[{"nameIdentifier":"26608","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kajihara, S."}]},{"nameIdentifiers":[{"nameIdentifier":"26644","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Furukawa, H."}]},{"nameIdentifiers":[{"nameIdentifier":"26609","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang, L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26610","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja, K. K."}]},{"nameIdentifiers":[{"nameIdentifier":"26611","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kinoshita, K."}]}]},"item_23_link_61":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_23_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"WRTLT`06"}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056657"}]},"item_23_text_37":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Innovation Plaza Fukuoka, Japan Science and Technology Agency, Fukuoka 814-0001, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"SynTest Technologies Inc., 505 S. Pastoria Avenue, Suite 101, Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Dept. of ECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI 53706, USA"},{"subitem_text_value":"Faculty of Informatics, Osaka Gakuin University, Suita 564-8511, Japan"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8100"}]},"item_23_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yamato,  Yuta"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Furukawa,  Hiroshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita,  Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-03"}],"displaytype":"detail","filename":"10056657.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056657.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6376/files/10056657.pdf"},"version_id":"c66b1a01-15b0-4b5d-b89e-6d8ff734d140"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-03"},"publish_date":"2020-02-03","publish_status":"0","recid":"6376","relation_version_is_last":true,"title":["An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:59.307642+00:00"}