{"created":"2023-05-15T11:59:47.223302+00:00","id":6377,"links":{},"metadata":{"_buckets":{"deposit":"22321de0-effd-43ba-9a40-259455631548"},"_deposit":{"created_by":3,"id":"6377","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6377"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006377","sets":["8:24"]},"author_link":["26623","1147","26626","26624","26617","6567","26625","26615","26616","26618","26619","1143","26627"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-01-22","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2007 IEEE International Test Conference"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive power supply noise caused by high launch-induced switching activity. This paper addresses this serious problem with a novel and practical post-ATPG X-filling scheme, featuring (1) a test relaxation method, called path keeping X-identification, that finds don't-care bits from a fully-specified transition delay test set while preserving its delay test quality by keeping the longest paths originally sensitized for fault detection, and (2) an X-filling method, called justification-probability-based fill (JP-fill), that is both effective and scalable for reducing launch-induced switching activity. This scheme can be easily implemented into any ATPG flow to effectively reduce power supply noise, without any impact on delay test quality, test data volume, area overhead, and circuit timing.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2007 IEEE International Test Conference, 21-26 October 2007, Santa Clara, CA, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal 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Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1089-3539","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2378-2250","subitem_source_identifier_type":"ISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056675"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"LIRMM, 161 rue Ada, 34392 Montpellier cedex 05, France"},{"subitem_text_value":"Hibikino R&D Center, DNP Co. Ltd., Kitakyushu 808-0135, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Sunnyvale, CA 94086, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8098"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki,  Tatsuya"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamato,  Yuta"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Girard,  Patrick"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ohsumi,  Yuji"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-03"}],"displaytype":"detail","filename":"10056675.pdf","filesize":[{"value":"425.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056675.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6377/files/10056675.pdf"},"version_id":"bfadd029-d3b2-4f59-89fe-6865067ed258"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Power supplies","subitem_subject_scheme":"Other"},{"subitem_subject":"Noise reduction","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Delay effects","subitem_subject_scheme":"Other"},{"subitem_subject":"Timing","subitem_subject_scheme":"Other"},{"subitem_subject":"Neodymium","subitem_subject_scheme":"Other"},{"subitem_subject":"Lab-on-a-chip","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit noise","subitem_subject_scheme":"Other"},{"subitem_subject":"Research and development","subitem_subject_scheme":"Other"},{"subitem_subject":"Gas detectors","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-03"},"publish_date":"2020-02-03","publish_status":"0","recid":"6377","relation_version_is_last":true,"title":["A novel scheme to reduce power supply noise for high-quality at-speed scan testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:56.836332+00:00"}