@article{oai:kyutech.repo.nii.ac.jp:00006379,
 author = {Enokimoto,  Kazunari and Wen, Xiaoqing and 温, 暁青 and Miyase, Kohei and 宮瀬, 紘平 and Huang,  Jiun-Lang and Kajihara, Seiji and 梶原, 誠司 and Wang,  Laung-Terng},
 journal = {2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems},
 month = {Jan},
 note = {Capture safety has become a major concern in at-speed scan testing since strong power supply noise caused by excessive launch switching activity (LSA) at transition launching in an at-speed test cycle often results in severe timing-failure-induced yield loss. Recently, a basic RM (rescue-&-mask) test generation scheme was proposed for guaranteeing capture safety rather than merely reducing LSA to some extent. This paper extends the basic RM scheme to broadcast-scan-based test compression by uniquely solving two test-compression-induced problems, namely (1) input X-bit insufficiency (i.e., fewer input X-bits are available for LSA reduction due to test compression) and (2) output X-bit impact (i.e., output X-bits may reduce fault coverage due to test response compaction). This leads to the broadcast-RM (broadcast-scan-based rescue-&-mask) test generation scheme. Evaluations on large benchmark circuits and an industrial circuit of about 1M gates clearly demonstrate that this novel scheme can indeed guarantee capture safety in at-speed scan testing with broadcast-scan-based test compression while minimizing its impact on both test quality and test costs., 2013 26th International Conference on VLSI Design, 5-10 January 2013, Pune, India},
 pages = {279--284},
 title = {On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression},
 year = {2013},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}