{"created":"2023-05-15T11:59:47.307799+00:00","id":6379,"links":{},"metadata":{"_buckets":{"deposit":"d66d29ed-4b6f-4a78-bc0e-9e92f8a80fc1"},"_deposit":{"created_by":3,"id":"6379","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6379"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006379","sets":["8:24"]},"author_link":["26635","1147","6567","26636","26641","26633","26639","1143","26630"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-01-05","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"284","bibliographicPageStart":"279","bibliographic_titles":[{"bibliographic_title":"2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Capture safety has become a major concern in at-speed scan testing since strong power supply noise caused by excessive launch switching activity (LSA) at transition launching in an at-speed test cycle often results in severe timing-failure-induced yield loss. Recently, a basic RM (rescue-&-mask) test generation scheme was proposed for guaranteeing capture safety rather than merely reducing LSA to some extent. This paper extends the basic RM scheme to broadcast-scan-based test compression by uniquely solving two test-compression-induced problems, namely (1) input X-bit insufficiency (i.e., fewer input X-bits are available for LSA reduction due to test compression) and (2) output X-bit impact (i.e., output X-bits may reduce fault coverage due to test response compaction). This leads to the broadcast-RM (broadcast-scan-based rescue-&-mask) test generation scheme. Evaluations on large benchmark circuits and an industrial circuit of about 1M gates clearly demonstrate that this novel scheme can indeed guarantee capture safety in at-speed scan testing with broadcast-scan-based test compression while minimizing its impact on both test quality and test costs.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2013 26th International Conference on VLSI Design, 5-10 January 2013, Pune, India","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26636","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Enokimoto,  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Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1063-9667","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2380-6923","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10274122"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan"},{"subitem_text_value":"National Taiwan University, Taipei, Taiwan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., Sunnyvale, CA, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8099"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Enokimoto,  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compression","subitem_subject_scheme":"Other"},{"subitem_subject":"test power","subitem_subject_scheme":"Other"},{"subitem_subject":"at-speed scan testing","subitem_subject_scheme":"Other"},{"subitem_subject":"power supply noise","subitem_subject_scheme":"Other"},{"subitem_subject":"capture safety","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test 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