{"created":"2023-05-15T11:59:47.433609+00:00","id":6382,"links":{},"metadata":{"_buckets":{"deposit":"99a1b556-bf56-4dce-8222-a1e7994159f0"},"_deposit":{"created_by":3,"id":"6382","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6382"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006382","sets":["8:24"]},"author_link":["1147","26654","26658","6567","26655","26656","26661","1143","26660","26657","26659"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-07-02","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60","bibliographicPageStart":"55","bibliographic_titles":[{"bibliographic_title":"2008 13th European Test Symposium"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Capture-safety, defined as the avoidance of any timing error due to unduly high launch switching activity in capture mode during at-speed scan testing, is critical for avoiding test- induced yield loss. Although point techniques are available for reducing capture IR-drop, there is a lack of complete capture-safe test generation flows. The paper addresses this problem by proposing a novel and practical capture-safe test generation scheme, featuring (1) reliable capture-safety checking and (2) effective capture-safety improvement by combining X-bit identification & X-filling with low launch- switching-activity test generation. This scheme is compatible with existing ATPG flows, and achieves capture-safety with no changes in the circuit-under-test or the clocking scheme.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2008 13th European Test Symposium, 25-29 May 2008, Verbania, Italy","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ETS.2008.13","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/ETS.2008.13"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/ETS.2008.13","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-0-7695-3150-2","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2008 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1530-1877","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1558-1780","subitem_source_identifier_type":"ISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056677"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan"},{"subitem_text_value":"Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan"},{"subitem_text_value":"Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan"},{"subitem_text_value":"Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan"},{"subitem_text_value":"Dept. of ECE, University of Wisconsin - Madison, Madison, WI 53706, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8102"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Furukawa,  H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamato,  Y."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takashima,  A."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Noda,  K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ito,  H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hatayama,  K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Aikyo,  T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  K. K."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-04"}],"displaytype":"detail","filename":"10056677.pdf","filesize":[{"value":"395.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056677.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6382/files/10056677.pdf"},"version_id":"0f905330-030f-46f5-81a1-1a78507e3587"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"At-Speed Scan Testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Yield Loss","subitem_subject_scheme":"Other"},{"subitem_subject":"Test Relaxation","subitem_subject_scheme":"Other"},{"subitem_subject":"X-Filling","subitem_subject_scheme":"Other"},{"subitem_subject":"Capture Mode","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Capture-Safe Test Generation Scheme for At-Speed Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Capture-Safe Test Generation Scheme for At-Speed Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-04"},"publish_date":"2020-02-04","publish_status":"0","recid":"6382","relation_version_is_last":true,"title":["A Capture-Safe Test Generation Scheme for At-Speed Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:57.717692+00:00"}