@article{oai:kyutech.repo.nii.ac.jp:00006383,
 author = {Enokimoto,  K. and Wen, Xiaoqing and 温, 暁青 and Yamato,  Y. and Miyase, Kohei and 宮瀬, 紘平 and Sone,  H. and Kajihara, Seiji and 梶原, 誠司 and Aso,  M. and Furukawa,  H.},
 journal = {2009 Asian Test Symposium},
 month = {Dec},
 note = {Reducing excessive launch switching activity (LSA) is now mandatory in at-speed scan testing for avoiding test-induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-safety checking, test relaxation, and X-filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-speed scan testing., 2009 Asian Test Symposium, 23-26 November 2009, Taichung, Taiwan},
 pages = {99--104},
 title = {CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing},
 year = {2009},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}