{"created":"2023-05-15T11:59:47.475135+00:00","id":6383,"links":{},"metadata":{"_buckets":{"deposit":"61f14de7-dbe9-47bf-890c-6a4a0946f0ee"},"_deposit":{"created_by":3,"id":"6383","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6383"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006383","sets":["8:24"]},"author_link":["26669","26668","1147","26666","6567","26664","1143","26662"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-12-28","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"104","bibliographicPageStart":"99","bibliographic_titles":[{"bibliographic_title":"2009 Asian Test Symposium"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Reducing excessive launch switching activity (LSA) is now mandatory in at-speed scan testing for avoiding test-induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-safety checking, test relaxation, and X-filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-speed scan testing.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2009 Asian Test Symposium, 23-26 November 2009, Taichung, Taiwan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ATS.2009.22","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/ATS.2009.22"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/ATS.2009.22","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-0-7695-3864-8","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056692"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Fukuoka Industry, Science & Technology Foundation, Fukuoka, Fukuoka 810-0001, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"NEC Micro Systems, Ltd., Kamimashiki, Kumamoto 861-2202, Japan"},{"subitem_text_value":"NEC Micro Systems, Ltd., Kamimashiki, Kumamoto 861-2202, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8103"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Enokimoto,  K."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yamato,  Y."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Sone,  H."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Aso,  M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Furukawa,  H."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-04"}],"displaytype":"detail","filename":"10056692.pdf","filesize":[{"value":"423.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056692.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6383/files/10056692.pdf"},"version_id":"1c2a4002-e918-44db-afe7-2c9466a50d03"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Power Supply Noise","subitem_subject_scheme":"Other"},{"subitem_subject":"Test Relaxation","subitem_subject_scheme":"Other"},{"subitem_subject":"X-Filling","subitem_subject_scheme":"Other"},{"subitem_subject":"Clock-Gating","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-04"},"publish_date":"2020-02-04","publish_status":"0","recid":"6383","relation_version_is_last":true,"title":["CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:55.711021+00:00"}