{"created":"2023-05-15T11:59:47.559998+00:00","id":6385,"links":{},"metadata":{"_buckets":{"deposit":"a0345e35-5946-4fc3-b524-f2b85de0c5a4"},"_deposit":{"created_by":3,"id":"6385","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6385"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006385","sets":["8:24"]},"author_link":["26684","1147","26688","26687","26686","1143","26682"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-12-23","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"24","bibliographicPageStart":"19","bibliographic_titles":[{"bibliographic_title":"2013 22nd Asian Test Symposium"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The applicability of at-speed scan-based logic built-in self-test (BIST) is being severely challenged by excessive capture power that may cause erroneous test responses for good chips. Different from conventional low-power BIST, this paper is the first that has explicitly focused on achieving capture power safety with a practical scheme called capture-power-safe BIST (CPS-BIST). The basic idea is to identify all possibly erroneous test responses and use the well-known technique of mask (partial-mask or full-mask) to block them from reaching the MISR. Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test quality and area overhead.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2013 22nd Asian Test Symposium, 18-21 November 2013, Jiaosi Township, Taiwan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ATS.2013.14","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/ATS.2013.14"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/ATS.2013.14","subitem_relation_type_select":"URI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10274078"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"LIRMM, 161 rue Ada, 34095 Montpellier, France"},{"subitem_text_value":"University of Connecticut, Storrs, CT 06296, USA"},{"subitem_text_value":"SynTest Technologies, Inc., Sunnyvale, CA 94086, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8105"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tomita,  A."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Sato,  Y."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Girard,  P."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tehranipoor,  M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  L.-T."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-04"}],"displaytype":"detail","filename":"10274078.pdf","filesize":[{"value":"770.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10274078.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6385/files/10274078.pdf"},"version_id":"a1ee143d-922b-4748-a993-67bc1e021e98"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Built-in self-test","subitem_subject_scheme":"Other"},{"subitem_subject":"Safety","subitem_subject_scheme":"Other"},{"subitem_subject":"Vectors","subitem_subject_scheme":"Other"},{"subitem_subject":"Radiation detectors","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic gates","subitem_subject_scheme":"Other"},{"subitem_subject":"Switches","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-04"},"publish_date":"2020-02-04","publish_status":"0","recid":"6385","relation_version_is_last":true,"title":["On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:52:04.901314+00:00"}