@article{oai:kyutech.repo.nii.ac.jp:00006386,
 author = {Wen, Xiaoqing and 温, 暁青 and Miyase, Kohei and 宮瀬, 紘平 and Suzuki,  Tatsuya and Yamato,  Yuta and Kajihara, Seiji and 梶原, 誠司 and Wang,  Laung-Terng and Saluja,  Kewal K.},
 journal = {2006 International Conference on Computer Design},
 month = {Nov},
 note = {X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling method based on two novel concepts: (1) X-score for X-filling target selection and (2) probabilistic weighted capture transition count for Y-filling value selection. Experimental results show the superiority of the new X-filling method for capture power reduction., 2006 International Conference on Computer Design, 1-4 October 2006, San Jose, CA, USA},
 pages = {251--258},
 title = {A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation},
 year = {2007},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}