{"created":"2023-05-15T11:59:47.602559+00:00","id":6386,"links":{},"metadata":{"_buckets":{"deposit":"a356f1d2-0d93-4f3f-aeb8-b212e62ba5ed"},"_deposit":{"created_by":3,"id":"6386","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6386"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006386","sets":["8:24"]},"author_link":["26696","1147","26699","26691","6567","26694","26695","26692","26698","1143","26702","26701"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-11-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"258","bibliographicPageStart":"251","bibliographic_titles":[{"bibliographic_title":"2006 International Conference on Computer Design"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling method based on two novel concepts: (1) X-score for X-filling target selection and (2) probabilistic weighted capture transition count for Y-filling value selection. Experimental results show the superiority of the new X-filling method for capture power reduction.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2006 International Conference on Computer Design, 1-4 October 2006, San Jose, CA, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26696","nameIdentifierScheme":"WEKO"}],"names":[{"name":"X. 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K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ICCD.2006.4380825","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/ICCD.2006.4380825"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/ICCD.2006.4380825","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-0-7803-9707-1","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1063-6404","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056669"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Innovation Plaza Fukuoka, JST, Fukuoka 814-0001, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Dept. of ECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI 53706, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8108"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki,  Tatsuya"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamato,  Yuta"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-05"}],"displaytype":"detail","filename":"10056669.pdf","filesize":[{"value":"515.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056669.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6386/files/10056669.pdf"},"version_id":"206e5662-7023-4a9f-b2be-b296294a2922"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Scan test","subitem_subject_scheme":"Other"},{"subitem_subject":"test generation","subitem_subject_scheme":"Other"},{"subitem_subject":"X-filling","subitem_subject_scheme":"Other"},{"subitem_subject":"capture","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-05"},"publish_date":"2020-02-05","publish_status":"0","recid":"6386","relation_version_is_last":true,"title":["A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:55.965029+00:00"}