@article{oai:kyutech.repo.nii.ac.jp:00006387,
 author = {Yamato,  Yuta and Wen, Xiaoqing and 温, 暁青 and Miyase, Kohei and 宮瀬, 紘平 and Furukawa,  Hiroshi and Kajihara, Seiji and 梶原, 誠司},
 journal = {2009 15th IEEE Pacific Rim International Symposium on Dependable Computing},
 month = {Dec},
 note = {Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the quality of previous X-filling methods for reducing launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this quality problem with a novel, GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner, and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on benchmark and industrial circuits, and initial results have demonstrated the usefulness of GA-fill., 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 16-18 November 2009, Shanghai, China},
 pages = {81--86},
 title = {A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing},
 year = {2009},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}