{"created":"2023-05-15T11:59:47.643799+00:00","id":6387,"links":{},"metadata":{"_buckets":{"deposit":"f41f8414-11c4-424d-868b-fba643414afd"},"_deposit":{"created_by":3,"id":"6387","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6387"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006387","sets":["8:24"]},"author_link":["26706","26703","1147","26708","6567","26711","1143"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-12-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"86","bibliographicPageStart":"81","bibliographic_titles":[{"bibliographic_title":"2009 15th IEEE Pacific Rim International Symposium on Dependable Computing"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the quality of previous X-filling methods for reducing launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this quality problem with a novel, GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner, and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on benchmark and industrial circuits, and initial results have demonstrated the usefulness of GA-fill.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 16-18 November 2009, Shanghai, China","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26708","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yamato,  Y."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Miyase","familyNameLang":"en"},{"familyName":"宮瀬","familyNameLang":"ja"},{"familyName":"ミヤセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Kohei","givenNameLang":"en"},{"givenName":"紘平","givenNameLang":"ja"},{"givenName":"コウヘイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"6567","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30452824","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030452824"},{"nameIdentifier":"6507979281","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=6507979281"},{"nameIdentifier":"219","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/219_ja.html"}],"names":[{"name":"Miyase, Kohei","nameLang":"en"},{"name":"宮瀬, 紘平","nameLang":"ja"},{"name":"ミヤセ, コウヘイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26711","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Furukawa,  H."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/PRDC.2009.21","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/PRDC.2009.21"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/PRDC.2009.21","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-0-7695-3849-5","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056691"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan, JST CREST"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan, JST CREST"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan, JST CREST"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8109"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamato,  Yuta"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Furukawa,  Hiroshi"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-05"}],"displaytype":"detail","filename":"10056691.pdf","filesize":[{"value":"542.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056691.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6387/files/10056691.pdf"},"version_id":"baa0e641-c486-40e6-a0e6-b86f1c0f0d0c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"X-filling","subitem_subject_scheme":"Other"},{"subitem_subject":"GA","subitem_subject_scheme":"Other"},{"subitem_subject":"Launch Switching Activity","subitem_subject_scheme":"Other"},{"subitem_subject":"IR-Drop At-Speed Scan Testing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-05"},"publish_date":"2020-02-05","publish_status":"0","recid":"6387","relation_version_is_last":true,"title":["A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:55.035884+00:00"}