{"created":"2023-05-15T11:59:47.684939+00:00","id":6388,"links":{},"metadata":{"_buckets":{"deposit":"4430bb47-ed85-46b9-95bf-f82702a0f7a1"},"_deposit":{"created_by":3,"id":"6388","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6388"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006388","sets":["8:24"]},"author_link":["26718","26719","1147","26717","6567","1143","26714"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"On pinpoint capture power management in at-speed scan test generation"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-01-07","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2012 IEEE International Test Conference "}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper proposes a novel scheme to manage capture power in a pinpoint manner for achieving guaranteed capture power safety, improved small-delay test capability, and minimal test cost impact in at-speed scan test generation. First, switching activity around each long path sensitized by a test vector is checked to characterize it as hot (with excessively-high switching activity), warm (with normal/functional switching activity), or cold (with excessively-low switching activity). Then, X-restoration/X-filling-based rescue is conducted on the test vector to reduce switching activity around hot paths. If the rescue is insufficient to turn a hot path into a warm path, mask is then conducted on expected test response data to instruct the tester to ignore the potentially-false test response value from the hot path, thus achieving guaranteed capture power safety. Finally, X-restoration/X-filling-based warm-up is conducted on the test vector to increase switching activity around cold paths for improving their small-delay test capability. This novel approach of pinpoint capture power management has significant advantages over the conventional approach of global capture power management, as demonstrated by evaluation results on large ITC'99 benchmark circuits and detailed path delay analysis.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2012 IEEE International Test Conference, 5-8 November 2012, Anaheim, CA, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TEST.2012.6401548","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/TEST.2012.6401548"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/TEST.2012.6401548","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4673-1595-1","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4673-1594-4","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4673-1593-7","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2378-2250","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1089-3539","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1089-3539","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10274125"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan"},{"subitem_text_value":"LIRMM, 161 rue Ada, 34095 Montpellier, France"},{"subitem_text_value":"University of Connecticut, Storrs, CT 06296, USA"},{"subitem_text_value":"SynTest Technologies, Inc., Sunnyvale, CA 94086, USA"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8106"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Nishida,  Y."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Girard,  P."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tehranipoor,  M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  L.-T."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-05"}],"displaytype":"detail","filename":"10274125.pdf","filesize":[{"value":"1.4 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