{"created":"2023-05-15T11:59:47.726159+00:00","id":6389,"links":{},"metadata":{"_buckets":{"deposit":"4493d3f6-275a-4696-a203-2ab313fffcf7"},"_deposit":{"created_by":3,"id":"6389","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6389"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006389","sets":["8:24"]},"author_link":["26731","26728","26730","1147","26733","26724","26732","26726","26729","26721","1143","26722","26725"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Low-Capture-Power Test Generation for Scan-Based At-Speed Testing"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-02-06","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"IEEE International Conference on Test, 2005"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield loss","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"IEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26728","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yamashita,  Y."}]},{"nameIdentifiers":[{"nameIdentifier":"26729","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Morishima,  S."}]},{"nameIdentifiers":[{"nameIdentifier":"26730","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kajiihara,  S."}]},{"nameIdentifiers":[{"nameIdentifier":"26731","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"nameIdentifiers":[{"nameIdentifier":"26732","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Saluja,  K. K."}]},{"nameIdentifiers":[{"nameIdentifier":"26733","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kinoshita,  K."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TEST.2005.1584068","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/TEST.2005.1584068"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/TEST.2005.1584068","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7803-9038-5","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1089-3539","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2378-2250","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056662"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA"},{"subitem_text_value":"Dept. of ECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI 53706, USA"},{"subitem_text_value":"Faculty of Informatics, Osaka Gakuin University, Suita 564-8511, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8107"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yamashita,  Yoshiyuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Morishima,  Shohei"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja,  Kewal K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita,  Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-05"}],"displaytype":"detail","filename":"10056662.pdf","filesize":[{"value":"147.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056662.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6389/files/10056662.pdf"},"version_id":"6dc6f8db-0084-400b-890e-9a48502c34df"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic test pattern generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit faults","subitem_subject_scheme":"Other"},{"subitem_subject":"Sequential analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Delay","subitem_subject_scheme":"Other"},{"subitem_subject":"Timing","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic circuits","subitem_subject_scheme":"Other"},{"subitem_subject":"Costs","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Low-capture-power test generation for scan-based at-speed testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Low-capture-power test generation for scan-based at-speed testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-05"},"publish_date":"2020-02-05","publish_status":"0","recid":"6389","relation_version_is_last":true,"title":["Low-capture-power test generation for scan-based at-speed testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:57.394669+00:00"}