{"created":"2023-05-15T11:59:47.931296+00:00","id":6394,"links":{},"metadata":{"_buckets":{"deposit":"d4d7b045-f8be-4008-8a06-0d83b16d87b6"},"_deposit":{"created_by":3,"id":"6394","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6394"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006394","sets":["8:24"]},"author_link":["26766","26761","26767","26756","26755","26763","26757","26764","26759","26753","26760","1143","26768","26758","26765"],"item_21_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"VirtualScan: a new compressed scan technology for test cost reduction"}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-01-31","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2004 International Conference on Test"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This work describes the VirtualScan technology for scan test cost reduction. Scan chains in a VirtualScan circuit are split into shorter ones and the gap between external scan ports and internal scan chains are bridged with a broadcaster and a compactor. Test patterns for a VirtualScan circuit are generated directly by one-pass VirtualScan ATPG, in which multi-capture clocking and maximum test compaction are supported. In addition, VirtualScan ATPG avoids unknown-value and aliasing effects algorithmically without adding any additional circuitry. The VirtualScan technology has achieved successful tape-outs of industrial chips and has been proven to be an efficient and easy-to-implement solution for scan test cost reduction.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2004 International Conference on Test, 26-28 October 2004, Charlotte, NC, USA, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26761","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang,  L.-T."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26763","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Furukawa,  H."}]},{"nameIdentifiers":[{"nameIdentifier":"26764","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Hsu,  F."}]},{"nameIdentifiers":[{"nameIdentifier":"26765","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Lin,  S."}]},{"nameIdentifiers":[{"nameIdentifier":"26766","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Tsai,  S."}]},{"nameIdentifiers":[{"nameIdentifier":"26767","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Abdel-Hafez,  K. S."}]},{"nameIdentifiers":[{"nameIdentifier":"26768","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wu,  S."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TEST.2004.1387356","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/TEST.2004.1387356"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/TEST.2004.1387356","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7803-8580-2","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2004 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056652"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale 94086, U.S.A."},{"subitem_text_value":"Department of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"NEC Micro Systems, Ltd., 2081-24 Tabaru, Mashiki-Machi, Kamimashiki-Gun, Kumamoto 861-2202, Japan"},{"subitem_text_value":"SynTest Technologies, Inc., Taiwan, 2F No. 27, Industry E. Rd. 9 Hsinchu, Taiwan"},{"subitem_text_value":"SynTest Technologies, Inc., Taiwan, 2F No. 27, Industry E. Rd. 9 Hsinchu, Taiwan"},{"subitem_text_value":"SynTest Technologies, Inc., Taiwan, 2F No. 27, Industry E. Rd. 9 Hsinchu, Taiwan"},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale 94086, U.S.A."},{"subitem_text_value":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale 94086, U.S.A."}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8112"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wang,  Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Furukawa,  Hiroshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hsu,  Fei-Sheng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Lin,  Shyh-Horng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsai,  Sen-Wei"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Abdel-Hafez,  Khader S."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wu,  Shianling"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-06"}],"displaytype":"detail","filename":"10056652.pdf","filesize":[{"value":"176.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056652.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6394/files/10056652.pdf"},"version_id":"46ed5a48-bc80-447a-a29a-7dc1e0fdb8d0"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Costs","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Integrated circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit faults","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic test pattern generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Electronic equipment testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Automatic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"System testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Manufacturing","subitem_subject_scheme":"Other"},{"subitem_subject":"Built-in self-test","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"VirtualScan: a new compressed scan technology for test cost reduction","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"VirtualScan: a new compressed scan technology for test cost reduction"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-06"},"publish_date":"2020-02-06","publish_status":"0","recid":"6394","relation_version_is_last":true,"title":["VirtualScan: a new compressed scan technology for test cost reduction"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:26.553116+00:00"}