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Application results of this scheme to two widely used IP cores are also reported.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Design, Automation and Test in Europe (DATE05), 7-11 March 2005, Munich, Germany","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/DATE.2005.70","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/DATE.2005.70"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/DATE.2005.70","subitem_relation_type_select":"URI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1530-1591","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1558-1101","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10056654"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Samsung Electronics, Co."},{"subitem_text_value":"Samsung Electronics, Co."},{"subitem_text_value":"SynTest Technologies, Inc."},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"SynTest Technologies, Inc., Taiwan"},{"subitem_text_value":"SynTest Korea, Ltd."},{"subitem_text_value":"SynTest Korea, Ltd."},{"subitem_text_value":"SynTest Technologies, Inc., Taiwan"},{"subitem_text_value":"SynTest Technologies, Inc."}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8113"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Cheon,  B."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Lee,  E."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang,  L.-T."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Hsu,  P."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Cho,  J."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Park,  J."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Chao,  H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wu,  S."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-06"}],"displaytype":"detail","filename":"10056654.pdf","filesize":[{"value":"54.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10056654.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6395/files/10056654.pdf"},"version_id":"aa6ee7d7-8115-4d90-9922-5c459b6c64fb"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Built-in self-test","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Clocks","subitem_subject_scheme":"Other"},{"subitem_subject":"Circuit faults","subitem_subject_scheme":"Other"},{"subitem_subject":"System testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Frequency","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic circuits","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic design","subitem_subject_scheme":"Other"},{"subitem_subject":"Costs","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"At-Speed Logic BIST for IP Cores","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"At-Speed Logic BIST for IP Cores"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-06"},"publish_date":"2020-02-06","publish_status":"0","recid":"6395","relation_version_is_last":true,"title":["At-Speed Logic BIST for IP Cores"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:28.385139+00:00"}