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Test strategies for low power devices
http://hdl.handle.net/10228/00007606
http://hdl.handle.net/10228/00007606c5d7cd2f-4c68-4cd0-a55e-330b69eb64a4
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10231665.pdf (258.1 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||
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| 公開日 | 2020-02-10 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| タイトル | ||||||
| タイトル | Test strategies for low power devices | |||||
| 言語 | en | |||||
| その他のタイトル | ||||||
| その他のタイトル | Test Strategies for Low Power Devices | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Ravikumar, C. P.
× Ravikumar, C. P.× Hirech, M.× 温, 暁青 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing of these low-cost, low-power devices is a daunting task. Depending on the target application, there are stringent guidelines on the number of defective parts per million shipped devices. At the same time, since such devices are cost-sensitive, test cost is a major consideration. Since system-level power-management techniques are employed in these devices, test generation must be power-management-aware to avoid stressing the power distribution infrastructure in the test mode. Structural test techniques such as scan test, with or without compression, can result in excessive heat dissipation during testing and damage the package. False failures may result due to the electrical and thermal stressing of the device in the test mode of operation, leading to yield loss. This paper considers different aspects of testing low-power devices and some new techniques to address these problems. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | Design, Automation and Test in Europe (DATE '08), 10-14 March 2008, Munich, Germany | |||||
| 書誌情報 |
en : DATE '08: Proceedings of the conference on Design, automation and test in Europe p. 728-733, 発行日 2008-03-10 |
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| 出版社 | ||||||
| 出版者 | ACM | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1145/1403375.1403552 | |||||
| ISBN | ||||||
| 識別子タイプ | ISBN | |||||
| 関連識別子 | 978-3-9810801-3-1 | |||||
| 日本十進分類法 | ||||||
| 主題Scheme | NDC | |||||
| 主題 | 548 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2008 ACM. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in "DATE '08: Proceedings of the conference on Design, automation and test in Europe", (10 March 2008) https://doi.org/10.1145/1403375.1403552 | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10231665 | |||||
| 連携ID | ||||||
| 値 | 8115 | |||||
