@article{oai:kyutech.repo.nii.ac.jp:00006397,
 author = {Wen, Xiaoqing and 温, 暁青},
 journal = {2011 International Green Computing Conference and Workshops},
 month = {Sep},
 note = {This paper first reviews the basics of VLSI testing, focusing on test generation and design for testability. Then it discusses the impact of test power in scan testing, and highlights the need for low-power VLSI testing., 2011 International Green Computing Conference and Workshops (IGCC 2011), July 25-28, 2011, Orlando, FL, USA},
 title = {VLSI Testing and Test Power},
 year = {2011},
 yomi = {オン, ギョウセイ}
}