@article{oai:kyutech.repo.nii.ac.jp:00006415,
 author = {Ma,  Ruijun and Holst, Stefan and ホルスト, シュテファン and Wen, Xiaoqing and 温, 暁青 and Yan,  Aibin and Xu,  Hui},
 journal = {2019 IEEE European Test Symposium (ETS)},
 month = {Aug},
 note = {As modern technology nodes become more susceptible to soft errors, many radiation hardened latch designs have been proposed. However, redundant circuitry used to tolerate soft errors in such hardened latches also reduces the test coverage of cell-internal manufacturing defects. To avoid potential test escapes that lead to soft error vulnerability and reliability issues, this paper proposes a novel Scan-Test-Aware Hardened Latch (STAHL). Simulation results show that STAHL has superior defect coverage compared to previous hardened latches while maintaining full radiation hardening in function mode., 24th IEEE European Test Symposium (ETS'19), May 27-31, 2019, Baden-Baden, Germany},
 title = {STAHL: A Novel Scan-Test-Aware Hardened Latch Design},
 year = {2019},
 yomi = {オン, ギョウセイ}
}