{"created":"2023-05-15T11:59:48.800909+00:00","id":6415,"links":{},"metadata":{"_buckets":{"deposit":"1f99d3f4-ac96-4f42-bb9c-4bc9cf5875e6"},"_deposit":{"created_by":3,"id":"6415","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6415"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006415","sets":["8:24"]},"author_link":["26868","26871","26863","26872","26866","26087","1143","26867"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-08-08","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2019 IEEE European Test Symposium (ETS)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"As modern technology nodes become more susceptible to soft errors, many radiation hardened latch designs have been proposed. However, redundant circuitry used to tolerate soft errors in such hardened latches also reduces the test coverage of cell-internal manufacturing defects. To avoid potential test escapes that lead to soft error vulnerability and reliability issues, this paper proposes a novel Scan-Test-Aware Hardened Latch (STAHL). Simulation results show that STAHL has superior defect coverage compared to previous hardened latches while maintaining full radiation hardening in function mode.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"24th IEEE European Test Symposium (ETS'19), May 27-31, 2019, Baden-Baden, Germany","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"26868","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ma,  R."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Holst","familyNameLang":"en"},{"familyName":"ホルスト","familyNameLang":"ja"}],"givenNames":[{"givenName":"Stefan","givenNameLang":"en"},{"givenName":"シュテファン","givenNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"26087","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"36924245700","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=36924245700"},{"nameIdentifier":"100000663","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/100000663_ja.html"}],"names":[{"name":"Holst, Stefan","nameLang":"en"},{"name":"ホルスト, シュテファン","nameLang":"ja"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"26871","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yan,  A."}]},{"nameIdentifiers":[{"nameIdentifier":"26872","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Xu,  H."}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ETS.2019.8791544","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"9781728111735","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1558-1780","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1530-1877","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10348529"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, Iizuka 820-8502, Japan"},{"subitem_text_value":"Anhui University, Hefei 230601, P. R. China"},{"subitem_text_value":"Anhui University of Science & Technology, Huainan 232000, P. R. China"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8131"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ma,  Ruijun"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Holst, Stefan","creatorNameLang":"en"},{"creatorName":"ホルスト, シュテファン","creatorNameLang":"ja"}],"familyNames":[{},{}],"givenNames":[{},{}],"nameIdentifiers":[{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yan,  Aibin"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Xu,  Hui"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-19"}],"displaytype":"detail","filename":"10348529.pdf","filesize":[{"value":"756.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10348529.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6415/files/10348529.pdf"},"version_id":"b10acda0-9920-47be-88ce-08e3e71a9e46"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"soft error","subitem_subject_scheme":"Other"},{"subitem_subject":"hardened latch","subitem_subject_scheme":"Other"},{"subitem_subject":"defect","subitem_subject_scheme":"Other"},{"subitem_subject":"scan test","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"STAHL: A Novel Scan-Test-Aware Hardened Latch Design","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"STAHL: A Novel Scan-Test-Aware Hardened Latch Design"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-19"},"publish_date":"2020-02-19","publish_status":"0","recid":"6415","relation_version_is_last":true,"title":["STAHL: A Novel Scan-Test-Aware Hardened Latch Design"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T09:01:55.265244+00:00"}