@article{oai:kyutech.repo.nii.ac.jp:00006470,
 author = {Nikita,  Kumari and Pandey,  Manish and Nagamatsu, Shuichi and 永松, 秀一 and Pandey, Shyam Sudhir and パンディ, シャム スディル},
 issue = {SC},
 journal = {Japanese Journal of Applied Physics},
 month = {Nov},
 note = {Fabrication of large-area thin films and their swift characterization is highly desired for the commercial aspects of the organic electronic devices. Although a number of techniques have been proposed for the large-area thin film fabrication, the microstructural variation is still an issue. In this work, the facile characterization of distribution in thickness and macromolecular ordering in the drop-casted and spin-coated poly(3-hexylthiophene) thin films have been performed through newly developed 2D positional mapping technique. Through this technique, a comparative analysis of the absorption spectra in terms of peak absorbance and excitonic bandwidth (W) was performed for the whole sample, the lower value of W observed for the drop-casted thin film depicts its molecular ordering. Moreover, the difference in W (≈ 10 meV) was noticed between two points (≈1 mm apart) on the drop-casted film, which corresponds to the difference in microstructural ordering and it is complicated to characterize through the conventional spectroscopic techniques.},
 pages = {SCCA06-1--SCCA06-6},
 title = {2D positional mapping of casting condition driven microstructural distribution in organic thin films},
 volume = {59},
 year = {2019},
 yomi = {ナガマツ, シュウイチ}
}