{"created":"2023-05-15T12:00:06.182836+00:00","id":6788,"links":{},"metadata":{"_buckets":{"deposit":"b63f99b1-80b4-4993-a943-653b877b003f"},"_deposit":{"created_by":3,"id":"6788","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6788"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006788","sets":["8:24"]},"author_link":["28766","28767","16176","28768","28769","28770"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-08-18","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"According to gaining importance of power electronics systems in the society, reliability issues of power semiconductor devices are the constrains on availability of the system operations. Regular interval based maintenance for higher availability, on the other hand, increases operation cost since the lifetime of power devices have a large deviation with production lots or conditions which they are used. Condition based maintenance (CBM) of power semiconductor devices will be a promising solution for both the availability and cost of power electronics system maintenance. In this study, a high signal resolution condition monitoring system board has been demonstrated. The system monitors real time V-I curve for both switching device and diode with case temperature and the data is stored on board memory and can be monitored on-line. The board was mounted on the gate driver board being supplied power from the gate driver board and demonstrated on a commercial 60kVA inverter.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD 2020), 13-18 September, 2020, Vienna, Austria （新型コロナ感染拡大に伴い、現地開催中止）","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ISPSD46842.2020.9170059","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-4836-6","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-4837-3","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2020 IEEE. Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1946-0201","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1063-6854","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Toshiba Mitsubishi-Electric Industrial Systems Corporation (TMEIC)"},{"subitem_text_value":"Toshiba Mitsubishi-Electric Industrial Systems Corporation (TMEIC)"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8514"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tsukuda,  Masanori"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Guan,  Li"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe,  Kazuha"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamaguchi,  Haruyuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takao,  Kenshi"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-23"}],"displaytype":"detail","filename":"nperc157.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc157.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6788/files/nperc157.pdf"},"version_id":"d1b3a0a1-e61d-476e-82d8-e8458b8aeea6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"V-I curve","subitem_subject_scheme":"Other"},{"subitem_subject":"Condition minitoring","subitem_subject_scheme":"Other"},{"subitem_subject":"Power devices","subitem_subject_scheme":"Other"},{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject":"power Diode","subitem_subject_scheme":"Other"},{"subitem_subject":"Condition based maintenance (CBM)","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"V-I Curve Based Condition Monitoring System for Power Devices","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"V-I Curve Based Condition Monitoring System for Power Devices"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-12-23"},"publish_date":"2020-12-23","publish_status":"0","recid":"6788","relation_version_is_last":true,"title":["V-I Curve Based Condition Monitoring System for Power Devices"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:48:49.039332+00:00"}