{"created":"2023-05-15T12:00:11.080072+00:00","id":6892,"links":{},"metadata":{"_buckets":{"deposit":"b8c50d27-ddf8-4a4f-80af-b2cc4014548b"},"_deposit":{"created_by":3,"id":"6892","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6892"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006892","sets":["8:24"]},"author_link":["16176","21156","29541","29540"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-04-19","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"55","bibliographicPageStart":"50","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"Journal of the Institute of Industrial Applications Engineers"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The active gate drive (AGD) technique is payed attention as a switching technique which can reduced both of switching loss and surge voltage.  So far, only switching loss and surge voltage of main switch have been discussed, and the reverse recovery characteristic of rectification diode has not been discussed.  In addition, the mechanism of loss and surge reduction has not been clarified.  In this paper, the influence of AGD on reverse recovery characteristics, and the mechanism of loss and surge reduction are discussed for system reliability improvement.  As a result, the mechanism of loss and surge reduction is clarified.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"産業応用工学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.12792/jiiae.8.50","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2020 Journal of the Institute of Industrial Applications Engineers. This work is licensed under a Creative Commons Attribution 4.0 International License. (https://creativecommons.org/licenses/by/4.0/)"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2187-8811","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2188-1758","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8625"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Abe, Seiya","creatorNameLang":"en"},{"creatorName":"安部, 征哉","creatorNameLang":"ja"},{"creatorName":"アベ, セイヤ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Yusuke,  Tokita"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masanori,  Tsukuda"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-03-23"}],"displaytype":"detail","filename":"nperc168.pdf","filesize":[{"value":"2.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc168.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6892/files/nperc168.pdf"},"version_id":"f2cc6e0d-b8e1-412e-9cfe-79d9675a1bc2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Active gate drive","subitem_subject_scheme":"Other"},{"subitem_subject":"Surge voltage","subitem_subject_scheme":"Other"},{"subitem_subject":"Switching loss","subitem_subject_scheme":"Other"},{"subitem_subject":"Reverse recovery loss","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Mechanism Clarification of Switching Loss and Surge Voltage / Current Reduction with Active Gate Drive for System Reliability Improvement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Mechanism Clarification of Switching Loss and Surge Voltage / Current Reduction with Active Gate Drive for System Reliability Improvement"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-23"},"publish_date":"2021-03-23","publish_status":"0","recid":"6892","relation_version_is_last":true,"title":["Mechanism Clarification of Switching Loss and Surge Voltage / Current Reduction with Active Gate Drive for System Reliability Improvement"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:00.962535+00:00"}