@article{oai:kyutech.repo.nii.ac.jp:00006942,
 author = {Gondo,  Masayuki and Miyake,  Yousuke and Kato,  Takaaki and Kajihara, Seiji and 梶原, 誠司},
 journal = {2020 IEEE 29th Asian Test Symposium (ATS)},
 month = {Dec},
 note = {An aging-tolerant ring oscillator (RO) has been proposed for a digital temperature and voltage sensor. This paper discusses on the effectiveness of aging-tolerance of the ROs through accelerated life test for a test chip with 65nm CMOS technology. The progress of delay degradation of the ROs is examined, and influence of delay degradation on measurement accuracy of the sensor is investigated. Experimental results show that the aging-tolerant ROs can mitigate delay degradation, and that the measurement errors of the sensor can be reduced. Compared with a sensor consisting of an aging-intolerant RO, temperature and voltage errors are reduced 2.5°C and 32mV, respectively., 29th IEEE Asian Test Symposium (ATS'20), November 22-25, 2020, Penang, Malaysia（オンライン開催に変更）},
 title = {On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor},
 year = {2020},
 yomi = {カジハラ, セイジ}
}