{"created":"2023-05-15T12:00:13.230831+00:00","id":6942,"links":{},"metadata":{"_buckets":{"deposit":"b1301507-f8f3-4a59-a229-e99f365f007e"},"_deposit":{"created_by":3,"id":"6942","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6942"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006942","sets":["8:24"]},"author_link":["29812","29813","1147","29816","29811","29815","29817"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-12-28","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2020 IEEE 29th Asian Test Symposium (ATS)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An aging-tolerant ring oscillator (RO) has been proposed for a digital temperature and voltage sensor. This paper discusses on the effectiveness of aging-tolerance of the ROs through accelerated life test for a test chip with 65nm CMOS technology. The progress of delay degradation of the ROs is examined, and influence of delay degradation on measurement accuracy of the sensor is investigated. Experimental results show that the aging-tolerant ROs can mitigate delay degradation, and that the measurement errors of the sensor can be reduced. Compared with a sensor consisting of an aging-intolerant RO, temperature and voltage errors are reduced 2.5°C and 32mV, respectively.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"29th IEEE Asian Test Symposium (ATS'20), November 22-25, 2020, Penang, Malaysia（オンライン開催に変更）","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"29815","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Gondo,  M."}]},{"nameIdentifiers":[{"nameIdentifier":"29816","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Miyake,  Y."}]},{"nameIdentifiers":[{"nameIdentifier":"29817","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kato,  T."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS49688.2020.9301588","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-7467-9","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-7468-6","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2020 IEEE. Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10362954"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8664"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Gondo,  Masayuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyake,  Yousuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato,  Takaaki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-04-07"}],"displaytype":"detail","filename":"10362954.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10362954.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6942/files/10362954.pdf"},"version_id":"d44f206a-9649-4f36-b789-15fb4ead0ee2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Temperature and voltage sensor","subitem_subject_scheme":"Other"},{"subitem_subject":"Ring Oscillator","subitem_subject_scheme":"Other"},{"subitem_subject":"Aging-tolerance","subitem_subject_scheme":"Other"},{"subitem_subject":"Accelerated life test","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-04-07"},"publish_date":"2021-04-07","publish_status":"0","recid":"6942","relation_version_is_last":true,"title":["On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test and Its Application to A Digital Sensor"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:59.809782+00:00"}