{"created":"2023-05-15T12:00:13.671043+00:00","id":6951,"links":{},"metadata":{"_buckets":{"deposit":"7554ed5e-18f6-463f-8baf-771ae0e79173"},"_deposit":{"created_by":3,"id":"6951","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6951"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006951","sets":["8:24"]},"author_link":["1147","29878","29877","29874","29875"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-10-16","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"117","bibliographicPageStart":"112","bibliographic_titles":[{"bibliographic_title":"2020 IEEE International Test Conference in Asia (ITC-Asia)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Path delay measurement in field is useful for not only detection of delay-related faults but also prediction of aging-induced delay faults. In order to utilize the delay measurement results for fault detection and fault prediction, the measured delay must be corrected because the circuit delay is varied in field due to environment such as temperature or voltage variations. This paper proposes a method of BIST-based path delay measurement in which the influence of environmental variations is eliminated. An on-chip sensor measures temperature and voltage during delay measurement. Using information from the temperature and voltage sensor and pre-computed temperature and voltage sensitivities of the circuit delay, the measured delay value is corrected to a delay value that would be obtained under a fixed temperature and voltage. Evaluation for a test chip with 65nm CMOS technology implementing the proposed method shows that errors of measured delays brought by environmental variations could be reduced from 2419 to 211 ps in the range of 30 to 80 °C and 1.05 to 1.35 V. This paper also discusses application and feasibility for degradation detection of the proposed method.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"International Test Conference in Asia (ITC-Asia 2020), September 23-25, 2020, Taipei City, Taiwan（現地およびオンラインで開催）","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"29877","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Miyake,  Y."}]},{"nameIdentifiers":[{"nameIdentifier":"29878","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kato,  T."}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ITC-Asia51099.2020.00031","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-8944-4","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-8945-1","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2020 IEEE. Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10362957"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8667"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miyake,  Yousuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato,  Takaaki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-04-08"}],"displaytype":"detail","filename":"10362957.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10362957.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6951/files/10362957.pdf"},"version_id":"829c4595-495e-4b7a-96a2-d2779f671002"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Field test","subitem_subject_scheme":"Other"},{"subitem_subject":"Logic BIST","subitem_subject_scheme":"Other"},{"subitem_subject":"Delay measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Degradation detection","subitem_subject_scheme":"Other"},{"subitem_subject":"Temperature and voltage variation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Path Delay Measurement with Correction for Temperature And Voltage Variations","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Path Delay Measurement with Correction for Temperature And Voltage Variations"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-04-08"},"publish_date":"2021-04-08","publish_status":"0","recid":"6951","relation_version_is_last":true,"title":["Path Delay Measurement with Correction for Temperature And Voltage Variations"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:52:08.825095+00:00"}