{"created":"2023-05-15T12:00:24.214165+00:00","id":7194,"links":{},"metadata":{"_buckets":{"deposit":"88b5e423-5413-43d9-b554-4fefa6f09bf2"},"_deposit":{"created_by":3,"id":"7194","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7194"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007194","sets":["8:24"]},"author_link":["16176","30963","30962"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-06-15","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"370","bibliographicPageStart":"367","bibliographic_titles":[{"bibliographic_title":"2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Digital gate driving methods have been recently proposed to control the IGBT switching transient by dynamically changing the drive power according to the input digital pattern. It has been reported that both surge voltage suppression and turn-off loss reduction can be consistently achieved. In the prior papers, however, the effect is evaluated based on only one optimum point, so that the effect of digital gate driving technology have not been accurately benchmarked for practical use. In this paper, we proposed a new benchmarking method for digital gate driven IGBTs using an approach of Eoff-Vsurge Trade-off shifts. We applied the proposed method to 12 types of IGBT samples and analyzed the benchmarking results.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD 2021), 30th of May and 3rd of June, 2021, Full Virtual Conference","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.23919/ISPSD50666.2021.9452197","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-4-88686-422-2","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-8985-7","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2021 IEEE. Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1946-0201","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1063-6854","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"9004"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Harasaki,  Kouji"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsukuda,  Masanori"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-07-02"}],"displaytype":"detail","filename":"nperc181.pdf","filesize":[{"value":"868.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc181.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7194/files/nperc181.pdf"},"version_id":"8a0b7a3d-89c0-4eae-aef4-377a4b565540"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject":"Benchmarking Method","subitem_subject_scheme":"Other"},{"subitem_subject":"Digital Gate Drive","subitem_subject_scheme":"Other"},{"subitem_subject":"Trade-off Shift","subitem_subject_scheme":"Other"},{"subitem_subject":"Turn-off Loss","subitem_subject_scheme":"Other"},{"subitem_subject":"Surge Voltage","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Benchmarking of Digital Gate Driven IGBTs: New Eoff-Vsurge Trade-off Approach","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Benchmarking of Digital Gate Driven IGBTs: New Eoff-Vsurge Trade-off Approach"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-07-02"},"publish_date":"2021-07-02","publish_status":"0","recid":"7194","relation_version_is_last":true,"title":["Benchmarking of Digital Gate Driven IGBTs: New Eoff-Vsurge Trade-off Approach"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:19.755776+00:00"}