{"created":"2023-05-15T12:00:24.277229+00:00","id":7195,"links":{},"metadata":{"_buckets":{"deposit":"4790cb53-4a44-47d4-a4d2-b0cc32ee8643"},"_deposit":{"created_by":3,"id":"7195","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7195"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007195","sets":["8:24"]},"author_link":["16176","30965","30966","16333"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-06-15","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"174","bibliographicPageStart":"171","bibliographic_titles":[{"bibliographic_title":"2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We demonstrated power cycling tests with different temperature coefficient samples and shown that cycles to failure strongly depends upon the coefficient. The test samples are investigated by SAT before and after the failure. As a result, we clarified the relationship between the DUT temperature coefficient and failure mechanism. The temperature coefficient is extremely important as a parameter for power cycle tests. High temperature coefficient can lead shorter cycles to failure by thermal runaway before bonding wire disconnection. We also proposed a new method to control temperature coefficient of DUT with gate voltage clamping to drain voltage.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD 2021), 30th of May and 3rd of June, 2021, Full Virtual Conference","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.23919/ISPSD50666.2021.9452298","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-4-88686-422-2","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-8985-7","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2021 IEEE. Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1946-0201","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1063-6854","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"9003"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kawauchi,  Yuma"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Akimoto,  Kenji"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Watanabe, Akihiko","creatorNameLang":"en"},{"creatorName":"渡邉, 晃彦","creatorNameLang":"ja"},{"creatorName":"ワタナベ, アキヒコ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-07-02"}],"displaytype":"detail","filename":"nperc180.pdf","filesize":[{"value":"421.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc180.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7195/files/nperc180.pdf"},"version_id":"3aff6689-8cf2-4123-ae6d-34985ca53552"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Power cycling test","subitem_subject_scheme":"Other"},{"subitem_subject":"Temperature Coefficient","subitem_subject_scheme":"Other"},{"subitem_subject":"SAT","subitem_subject_scheme":"Other"},{"subitem_subject":"Thermal Runaway","subitem_subject_scheme":"Other"},{"subitem_subject":"Solder Crack","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"DUT Temperature Coefficient and Power Cycles to Failure","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DUT Temperature Coefficient and Power Cycles to Failure"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-07-02"},"publish_date":"2021-07-02","publish_status":"0","recid":"7195","relation_version_is_last":true,"title":["DUT Temperature Coefficient and Power Cycles to Failure"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:43.740056+00:00"}