@article{oai:kyutech.repo.nii.ac.jp:00007270,
 author = {Sudo,  M. and Nagamatsu,  T. and Tsukuda,  M. and Omura, Ichiro and 大村, 一郎},
 journal = {Microelectronics Reliability},
 month = {Sep},
 note = {Increase of power bus voltages in spacecraft are expected with the power demand growth. Accordingly, high voltage semiconductor devices in the power supply system will be required to withstand high energy and high flux cosmic ray environment. In this paper, we propose a new formula to calculate failure rate for power semiconductor devices in space application.},
 pages = {113396-1--113396-8},
 title = {Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters},
 volume = {100-101},
 year = {2019},
 yomi = {オオムラ, イチロウ}
}