{"created":"2023-05-15T12:00:27.830004+00:00","id":7270,"links":{},"metadata":{"_buckets":{"deposit":"fd4fe9b1-249d-43ca-af24-f2583b260fa4"},"_deposit":{"created_by":3,"id":"7270","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7270"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007270","sets":["8:24"]},"author_link":["31385","31384","16176","31383"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-09-23","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"113396-8","bibliographicPageStart":"113396-1","bibliographicVolumeNumber":"100-101","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Increase of power bus voltages in spacecraft are expected with the power demand growth. Accordingly, high voltage semiconductor devices in the power supply system will be required to withstand high energy and high flux cosmic ray environment. In this paper, we propose a new formula to calculate failure rate for power semiconductor devices in space application.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2019.07.001","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2019 Elsevier Ltd. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"538","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8015"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sudo,  M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nagamatsu,  T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsukuda,  M."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-09-24"}],"displaytype":"detail","filename":"nperc132.pdf","filesize":[{"value":"2.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc132.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7270/files/nperc132.pdf"},"version_id":"31034dde-dfab-4015-aba5-46a37b7b1af7"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-09-24"},"publish_date":"2021-09-24","publish_status":"0","recid":"7270","relation_version_is_last":true,"title":["Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:48:59.521552+00:00"}