{"created":"2023-05-15T12:00:27.955887+00:00","id":7273,"links":{},"metadata":{"_buckets":{"deposit":"f72220cb-c67a-4d29-ae6a-0d466eccebff"},"_deposit":{"created_by":14,"id":"7273","owners":[14],"pid":{"revision_id":0,"type":"depid","value":"7273"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007273","sets":["8:24"]},"author_link":["16333","31396","402","16176"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-09-23","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"113399-5","bibliographicPageStart":"113399-1","bibliographicVolumeNumber":"100-101","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An image diagnosis by deep learning was applied to failure analysis of power devices. A series of images during a process to failure by power cycling test was used for this method. The images were obtained by a scanning acoustic microscopy of our real-time monitoring system. An image classifier was designed based on a convolutional neural network (CNNs). A developed classifier successfully diagnosed input image into a normal device and an abnormal device. The accuracy of classification was improved by introducing a pre-training and an overlapping pooling into the system. A technique to extract a feature related a failure is essential for the failure analysis based on the real-time monitoring and the deep learning is one likely candidate for it.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"Elsevier","subitem_publisher_language":"en"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2019.113399","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2019 Elsevier Ltd. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1872-941X","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8016"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Watanabe, Akihiko","creatorNameLang":"en"},{"creatorName":"渡邉, 晃彦","creatorNameLang":"ja"},{"creatorName":"ワタナベ, アキヒコ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Hirose, Naoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorAlternatives":[{"creatorAlternative":"Kamiya, Tohru","creatorAlternativeLang":"en"},{"creatorAlternative":"神谷, 亨","creatorAlternativeLang":"ja"},{"creatorAlternative":"カミヤ, トオル","creatorAlternativeLang":"ja-Kana"}],"creatorNames":[{"creatorName":"Kim, Hyungseop","creatorNameLang":"en"},{"creatorName":"金, 亨燮","creatorNameLang":"ja"}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-09-24"}],"displaytype":"detail","filename":"nperc133.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc133.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7273/files/nperc133.pdf"},"version_id":"9a4741a2-dc27-45b8-a5c3-38c2a4718948"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Convolutional neural network (CNNs) based image diagnosis for failure analysis of power devices","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Convolutional neural network (CNNs) based image diagnosis for failure analysis of power devices","subitem_title_language":"en"}]},"item_type_id":"21","owner":"14","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2021-09-24"},"publish_date":"2021-09-24","publish_status":"0","recid":"7273","relation_version_is_last":true,"title":["Convolutional neural network (CNNs) based image diagnosis for failure analysis of power devices"],"weko_creator_id":"14","weko_shared_id":-1},"updated":"2023-10-26T05:05:22.364478+00:00"}