{"created":"2023-05-15T12:00:29.952826+00:00","id":7320,"links":{},"metadata":{"_buckets":{"deposit":"c3f4aa39-a948-49c3-9c9c-7108025b9e4b"},"_deposit":{"created_by":3,"id":"7320","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7320"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007320","sets":["8:24"]},"author_link":["31663","31665","31450","31664"],"control_number":"7320","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-05-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"266","bibliographicPageStart":"263","bibliographic_titles":[{"bibliographic_title":"2014 International Symposium on Electromagnetic Compatibility"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The common-mode current on AC cable is one of radiated disturbance source below 300 MHz. The method of using common-mode absorbing device (CMAD) is discussed to improve reproducibility of test result by stabilizing the termination impedance of AC cable. However, CMAD can't stabilize the differential-mode impedance because this acts as a kind of common-mode choke coil. In this paper, the influence of the differential-mode termination impedance was studied. The measurement results of disturbance current on AC cable showed that the differential-mode level between AC power line and ground line is larger than the common-mode level. The study using a simple circuit model suggested that the differential-mode current could be converted to the common-mode current by changing the termination impedance between AC power line and ground line. The experiment was carried out by using the artificial AC network which has a function to change both common-mode and differential-mode termination impedance. The results showed that a common-mode level fluctuated by changing the termination impedance. The results also showed that the influence to the common-mode current and the radiated electric field strength in the case of the comb generator was smaller than that in the case of the PC.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC’14/Tokyo), May 12-16, 2004, Hitotsubashi Hall (National Center of Science), Tokyo, Japan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.34385/proc.18.14A-A6","subitem_relation_type_select":"DOI"}}]},"item_21_relation_66":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"230000001257","subitem_relation_type_select":"NAID"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2014 IEICE"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-5079","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"547","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical and Electronic Engineering, Kyushu Institute of Technology, Kitakyushu, Japan"},{"subitem_text_value":"Department of Electrical and Electronic Engineering, Kyushu Institute of Technology, Kitakyushu, Japan"},{"subitem_text_value":"Accreditation Operations Department, Voluntary EMC Laboratory Accreditation Center, Tokyo, Japan"},{"subitem_text_value":"VCCI Council, Tokyo, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"9747"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kuwabara, Nobuo","creatorNameLang":"en"},{"creatorName":"桑原, 伸夫","creatorNameLang":"ja"},{"creatorName":"クワバラ, ノブオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Nakanushi,  Takuto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Osabe,  Kunihiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Muramatsu,  Hidenori","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-11-11"}],"displaytype":"detail","filename":"EMC_proc.18.14A-A6.pdf","filesize":[{"value":"253.6 kB"}],"format":"application/octet-stream","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"EMC_proc.18.14A-A6.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7320/files/EMC_proc.18.14A-A6.pdf"},"version_id":"b516fafd-06f9-4d16-80bd-ed2c5bdb075d"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Radiated disturbance test","subitem_subject_scheme":"Other"},{"subitem_subject":"Common-mode current","subitem_subject_scheme":"Other"},{"subitem_subject":"Differential-mode current","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Influence of Termination Impedance to Radiated Emission from AC Cable with Ferrite Cores Array below 300 MHz","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Influence of Termination Impedance to Radiated Emission from AC Cable with Ferrite Cores Array below 300 MHz","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2021-11-11"},"publish_date":"2021-11-11","publish_status":"0","recid":"7320","relation_version_is_last":true,"title":["Influence of Termination Impedance to Radiated Emission from AC Cable with Ferrite Cores Array below 300 MHz"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T09:49:53.680099+00:00"}