{"created":"2023-05-15T12:00:30.503544+00:00","id":7333,"links":{},"metadata":{"_buckets":{"deposit":"581ff20b-c3e5-4116-b37c-bcbf0b9e3f24"},"_deposit":{"created_by":3,"id":"7333","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7333"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007333","sets":["8:24"]},"author_link":["31713","31712","31714","31450"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-12-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"281","bibliographicPageStart":"274","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"Journal of Korean Institute of Electromagnetic Engineering and Science"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High-speed telecommunication systems are influenced by electromagnetic environments because they need a wide bandwidth to transmit signals. Immunity tests of telecommunication equipment are effective for improving its immunity to electromagnetic environments. However, immunity tests are expensive to carry out because there are several different tests. The correlation among the tests should therefore be examined in order to reduce the kinds of tests that are necessary. This paper investigates the correlation between the electrical fast transient/burst (EFTB) test and the radio frequency (RF) conductive immunity test. Imitation equipment was constructed with a balun, and a baseband signal was transmitted from the associated equipment to the imitation equipment. Then, disturbances were applied to the equipment, and the telecommunication quality was evaluated by using the bit error rate (BER). The results from the EFTB test indicated that the BER was less than 6×10 −5 and the value was independent of the peak value. The results from the RF conductive immunity test indicated that the BER was affected by the longitudinal conversion loss (LCL).","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Korean Institute of Electromagnetic Engineering and Science"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.5515/JKIEES.2011.11.4.274","subitem_relation_type_select":"DOI"}}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2671-7255","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2671-7263","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"547","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of Electrical Engineering and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Dept. of Electrical Engineering and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Energy and Environment Systems Laboratories, Nippon Telegraph and Telephone Corporation (NTT)"},{"subitem_text_value":"Energy and Environment Systems Laboratories, Nippon Telegraph and Telephone Corporation (NTT)"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"9759"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kuwabara, Nobuo","creatorNameLang":"en"},{"creatorName":"桑原, 伸夫","creatorNameLang":"ja"},{"creatorName":"クワバラ, ノブオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Irie,  Yasuhiro"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hirasawa,  Norihito"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Akiyama,  Yoshiharu"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-11-12"}],"displaytype":"detail","filename":"JKIEES.2011.11.4.274.pdf","filesize":[{"value":"2.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"JKIEES.2011.11.4.274.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7333/files/JKIEES.2011.11.4.274.pdf"},"version_id":"c8f6f17c-cbbb-4d76-965e-228103d8aba8"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"EFTB","subitem_subject_scheme":"Other"},{"subitem_subject":"RF Conductive Immunity","subitem_subject_scheme":"Other"},{"subitem_subject":"Bit Error Rate","subitem_subject_scheme":"Other"},{"subitem_subject":"Base Band Signal","subitem_subject_scheme":"Other"},{"subitem_subject":"Longitudinal Conversion Loss (LCL)","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-11-12"},"publish_date":"2021-11-12","publish_status":"0","recid":"7333","relation_version_is_last":true,"title":["Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T09:49:48.904741+00:00"}