{"created":"2023-05-15T12:00:30.924660+00:00","id":7343,"links":{},"metadata":{"_buckets":{"deposit":"a20dd1c2-42c5-4598-b813-232141c719b6"},"_deposit":{"created_by":3,"id":"7343","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7343"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007343","sets":["8:24"]},"author_link":["31450","31753"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1994-05-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"24","bibliographicPageStart":"21","bibliographic_titles":[{"bibliographic_title":"1994 IEEE Instrumentation and Measurement Technology Conference"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes a method of improving the frequency response of an electric field sensor. A modified LiNbO/sub 3/ substrate shape reduces the sensitivity deviation from 4 [dB] to 1 [dB] and the maximum operating frequency is raised from 300 [MHz] to 1 [GHz] by using a resistive loaded element.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"1994 IEEE Instrumentation and Measurement Technology Conference, May 10-12, 1994, Grand Hotel Hamamatsu, Hamamatsu, Japan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/IMTC.1994.352137","subitem_relation_type_select":"DOI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7803-1880-3","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 1994 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"547","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"NTT Telecommunication Network Laboratories, 3-9-11 Midori-cho Musashino-shi, Tokyo 180, Japan"},{"subitem_text_value":"NTT Telecommunication Network Laboratories, 3-9-11 Midori-cho Musashino-shi, Tokyo 180, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"9770"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kuwabara, Nobuo","creatorNameLang":"en"},{"creatorName":"桑原, 伸夫","creatorNameLang":"ja"},{"creatorName":"クワバラ, ノブオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Kobayashi,  Ryuichi"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-11-15"}],"displaytype":"detail","filename":"MTC.1994.352137.pdf","filesize":[{"value":"1.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"MTC.1994.352137.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7343/files/MTC.1994.352137.pdf"},"version_id":"e6b697a3-59c8-4b01-9c22-1a2d55d19321"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Optical sensors","subitem_subject_scheme":"Other"},{"subitem_subject":"Optical modulation","subitem_subject_scheme":"Other"},{"subitem_subject":"Frequency response","subitem_subject_scheme":"Other"},{"subitem_subject":"Optical interferometry","subitem_subject_scheme":"Other"},{"subitem_subject":"Optical refraction","subitem_subject_scheme":"Other"},{"subitem_subject":"Optical variables control","subitem_subject_scheme":"Other"},{"subitem_subject":"Resonance","subitem_subject_scheme":"Other"},{"subitem_subject":"Electromagnetic compatibility","subitem_subject_scheme":"Other"},{"subitem_subject":"Magnetic field measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Electric variables measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Frequency Response Improvement of Electric Field Sensor using Optical Modulator","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Frequency Response Improvement of Electric Field Sensor using Optical Modulator"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-11-15"},"publish_date":"2021-11-15","publish_status":"0","recid":"7343","relation_version_is_last":true,"title":["Frequency Response Improvement of Electric Field Sensor using Optical Modulator"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T09:49:58.453245+00:00"}