{"created":"2023-05-15T11:55:42.533194+00:00","id":736,"links":{},"metadata":{"_buckets":{"deposit":"47f147c7-ac1f-4989-8731-b7ac31ebcf1f"},"_deposit":{"created_by":3,"id":"736","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"736"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000736","sets":["8:24"]},"author_link":["879"],"control_number":"736","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"536","bibliographicPageStart":"524","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Although the Weibull distribution is widely used in a variety of reliability applications, difficulties in its treatment, particularly in three parameter cases in the maximum likelihood estimation, hinder us from using the distribution. The extended Weibull distribution proposed by Marshall and Olkin (1997) can avoid the difficulties which appear in the conventional Weibull distribution models. This paper shows the maximum likelihood estimation method in the extended Weibull distribution model. The paper also illustrates some typical applications for breakdown voltage estimation in which the extended models are superior to the conventional Weibull models. The central discussion is whether the shape parameters in the extended model accomplish the mass shifting effect of the distribution.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Hirose","familyNameLang":"en"},{"familyName":"廣瀬","familyNameLang":"ja"},{"familyName":"ヒロセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Hideo","givenNameLang":"en"},{"givenName":"英雄","givenNameLang":"ja"},{"givenName":"ヒデオ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"879","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60275401","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000060275401"},{"nameIdentifier":"56153010700","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=56153010700"}],"names":[{"name":"Hirose, Hideo","nameLang":"en"},{"name":"廣瀬, 英雄","nameLang":"ja"},{"name":"ヒロセ, ヒデオ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TDEI.2002.1024429","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/TDEI.2002.1024429"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/TDEI.2002.1024429","subitem_relation_type_select":"URI"}}]},"item_21_relation_66":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120002440946","subitem_relation_type_select":"NAID"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1070-9878","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1558-4135","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of Comput. Sci. & Electron., Kyushu Institute of Technology, Fukuoka"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Hirose, Hideo","creatorNameLang":"en"},{"creatorName":"廣瀬, 英雄","creatorNameLang":"ja"},{"creatorName":"ヒロセ, ヒデオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2008-02-14"}],"displaytype":"detail","filename":"Maximum_20080212155426_001.pdf","filesize":[{"value":"3.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Maximum_20080212155426_001.pdf","url":"https://kyutech.repo.nii.ac.jp/record/736/files/Maximum_20080212155426_001.pdf"},"version_id":"2e7d89e8-c424-4140-9268-876e864022dd"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-02-14"},"publish_date":"2008-02-14","publish_status":"0","recid":"736","relation_version_is_last":true,"title":["Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T09:33:54.479129+00:00"}