{"created":"2023-05-15T11:55:42.657594+00:00","id":739,"links":{},"metadata":{"_buckets":{"deposit":"57f63b85-c0a2-4a01-8846-cea7fef60a7d"},"_deposit":{"created_by":3,"id":"739","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"739"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000739","sets":["8:24"]},"author_link":["879"],"control_number":"739","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"423","bibliographicPageStart":"418","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The estimation problems for the conventional step-up method (the observed breakdown voltages are not given at all) and the new step-up method (some of the observed breakdown voltages are given) are analyzed when the underlying probability distribution is assumed to be a Weibull model. This paper is a consecutive research of the case that the underlying probability distribution is assumed to be a normal model. Similarly to the normal model, the new step-up test method, in the Weibull model, also has advantages compared to the conventional method: (1) the confidence intervals of the estimates become smaller and (2) the estimates can be obtained with higher probability. The bias observed when sample size is small can be reduced by using the bootstrap method.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Hirose","familyNameLang":"en"},{"familyName":"廣瀬","familyNameLang":"ja"},{"familyName":"ヒロセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Hideo","givenNameLang":"en"},{"givenName":"英雄","givenNameLang":"ja"},{"givenName":"ヒデオ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"879","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60275401","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000060275401"},{"nameIdentifier":"56153010700","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=56153010700"}],"names":[{"name":"Hirose, Hideo","nameLang":"en"},{"name":"廣瀬, 英雄","nameLang":"ja"},{"name":"ヒロセ, ヒデオ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TDEI.2004.1306720","subitem_relation_type_select":"DOI"}}]},"item_21_relation_66":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120002440949","subitem_relation_type_select":"NAID"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1070-9878","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1558-4135","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of Syst. Innovation and Informatics, Kyushu Institute of Technology, Fukuoka, Japan;"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Hirose, Hideo","creatorNameLang":"en"},{"creatorName":"廣瀬, 英雄","creatorNameLang":"ja"},{"creatorName":"ヒロセ, ヒデオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2008-02-19"}],"displaytype":"detail","filename":"Weibull-model_20080212151503_001.pdf","filesize":[{"value":"1.4 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Weibull-model_20080212151503_001.pdf","url":"https://kyutech.repo.nii.ac.jp/record/739/files/Weibull-model_20080212151503_001.pdf"},"version_id":"3a9d1490-48b2-491b-94f1-9935bfa2edda"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"More accurate breakdown voltage estimation for the new step-up test method in the Weibull model","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"More accurate breakdown voltage estimation for the new step-up test method in the Weibull model","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-02-19"},"publish_date":"2008-02-19","publish_status":"0","recid":"739","relation_version_is_last":true,"title":["More accurate breakdown voltage estimation for the new step-up test method in the Weibull model"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T09:33:52.043948+00:00"}