{"created":"2023-05-15T11:55:42.699660+00:00","id":740,"links":{},"metadata":{"_buckets":{"deposit":"b827d63c-9888-49b1-9c9d-b547544fccea"},"_deposit":{"created_by":3,"id":"740","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"740"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000740","sets":["8:24"]},"author_link":["879"],"control_number":"740","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"482","bibliographicPageStart":"475","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The step-up method is used to estimate the impulse breakdown voltages when the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution in the step-up method, when (1) the observed breakdown voltage itself is available and (2) it is not available. The former case has many advantages compared to the latter case such that (i) the confidence intervals of the estimates become smaller and (ii) the estimates can be obtained with higher probability. Consequently, this paper recommends using the estimates of the underlying distribution for the breakdown voltages instead of the nominal breakdown voltages. Some illustrative examples are given.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Hirose","familyNameLang":"en"},{"familyName":"廣瀬","familyNameLang":"ja"},{"familyName":"ヒロセ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Hideo","givenNameLang":"en"},{"givenName":"英雄","givenNameLang":"ja"},{"givenName":"ヒデオ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"879","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60275401","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000060275401"},{"nameIdentifier":"56153010700","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=56153010700"}],"names":[{"name":"Hirose, Hideo","nameLang":"en"},{"name":"廣瀬, 英雄","nameLang":"ja"},{"name":"ヒロセ, ヒデオ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TDEI.2003.1207475","subitem_relation_type_select":"DOI"}}]},"item_21_relation_66":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120002440950","subitem_relation_type_select":"NAID"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1070-9878","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1558-4135","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of Control & Eng. Sci., Kyushu Institute of Technology, Fukuoka, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Hirose, Hideo","creatorNameLang":"en"},{"creatorName":"廣瀬, 英雄","creatorNameLang":"ja"},{"creatorName":"ヒロセ, ヒデオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2008-02-19"}],"displaytype":"detail","filename":"More-Accurate_20080212151555_001.pdf","filesize":[{"value":"1.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"More-Accurate_20080212151555_001.pdf","url":"https://kyutech.repo.nii.ac.jp/record/740/files/More-Accurate_20080212151555_001.pdf"},"version_id":"94f7f411-f2d1-4563-8f29-959fba578d8a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"More accurate breakdown voltage estimation for the new step-up test method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"More accurate breakdown voltage estimation for the new step-up test method","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-02-19"},"publish_date":"2008-02-19","publish_status":"0","recid":"740","relation_version_is_last":true,"title":["More accurate breakdown voltage estimation for the new step-up test method"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T09:33:54.708107+00:00"}