{"created":"2023-05-15T12:00:42.512975+00:00","id":7626,"links":{},"metadata":{"_buckets":{"deposit":"b5c5ad22-dbf8-4e2f-bfbd-6197c97f5c0a"},"_deposit":{"created_by":3,"id":"7626","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7626"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00007626","sets":["8:24"]},"author_link":["32980","32981","27557"],"control_number":"7626","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2022-04-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"137","bibliographicPageStart":"131","bibliographicVolumeNumber":"45","bibliographic_titles":[{"bibliographic_title":"ETRI Journal","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The phase reconstruction process in digital holographic microscopy involves a trade-off between the phase error and the high-spatial-frequency components. In this reconstruction process, if the narrow region of the sideband is windowed in the Fourier domain, the phase error from the DC component will be reduced, but the high-spatial-frequency components will be lost. However, if the wide region is windowed, the 3D profile will include the high-spatial-frequency components, but the phase error will increase. To solve this trade-off, we propose the high-variance pixel averaging method, which uses the variance map of the reconstructed depth profiles of the windowed sidebands of different sizes in the Fourier domain to classify the phase error and the high-spatial-frequency components. Our proposed method calculates the average of the high-variance pixels because they include the noise from the DC component. In addition, for the nonaveraged pixels, the reconstructed phase data created by the spatial frequency components of the widest window are used to include the high-spatial-frequency components. We explain the mathematical algorithm of our proposed method and compare it with conventional methods to verify its advantages.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_text":"https://hyokadb02.jimu.kyutech.ac.jp/html/215_ja.html","subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/215_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"Wiley"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.4218/etrij.2021-0311","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2022 ETRI. This is an Open Access article distributed under the term of Korea Open Government License (KOGL) Type 4: Source Indication + Commercial Use Prohibition + Change Prohibition (http://www.kogl.or.kr/info/licenseTypeEn.do)."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA11085645","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1225-6463","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"2233-7326","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"535","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10391322"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"10392"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAlternatives":[{"creatorAlternative":"Kim, H.W.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Kim, Hyun-Woo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"32980","nameIdentifierScheme":"WEKO"}]},{"creatorAlternatives":[{"creatorAlternative":"Cho, M.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Cho, Myungjin","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"32981","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Lee, Min-Chul","creatorNameLang":"en"},{"creatorName":"李, 旻哲","creatorNameLang":"ja"},{"creatorName":"イ, ミンチョル","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Lee","familyNameLang":"en"},{"familyName":"李","familyNameLang":"ja"},{"familyName":"イ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Min-Chul","givenNameLang":"en"},{"givenName":"旻哲","givenNameLang":"ja"},{"givenName":"ミンチョル","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"27557","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60363397","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000060363397"},{"nameIdentifier":"56132412500","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=56132412500"},{"nameIdentifier":"0000-0001-8469-0288","nameIdentifierScheme":"ORCiD","nameIdentifierURI":"https://orcid.org/0000-0001-8469-0288"},{"nameIdentifier":"215","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/215_ja.html"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-05-09"}],"displaytype":"detail","filename":"etrij.2021-0311.pdf","filesize":[{"value":"3.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"etrij.2021-0311.pdf","url":"https://kyutech.repo.nii.ac.jp/record/7626/files/etrij.2021-0311.pdf"},"version_id":"5d558094-ba78-4fb6-a931-7f71f6263d63"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"digital holographic microscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"noise reduction","subitem_subject_scheme":"Other"},{"subitem_subject":"three-dimensional imaging","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Noise reduction method using a variance map of the phase differences in digital holographic microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Noise reduction method using a variance map of the phase differences in digital holographic microscopy","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2022-05-09"},"publish_date":"2022-05-09","publish_status":"0","recid":"7626","relation_version_is_last":true,"title":["Noise reduction method using a variance map of the phase differences in digital holographic microscopy"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-07-01T05:00:16.108692+00:00"}