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Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test
http://hdl.handle.net/10228/00006259
http://hdl.handle.net/10228/00006259c0280e50-53a3-4b96-8509-7c0ccba57c8d
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
ats_156_161.pdf (1.5 MB)
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| Item type | 会議発表論文 = Conference Paper(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-07-11 | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
| 資源タイプ | conference paper | |||||
| タイトル | ||||||
| タイトル | Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 著者 |
Miyake, Yousuke
× Miyake, Yousuke× Sato, Yasuo× 梶原, 誠司× Miura, Yukiya |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Field test is performed in diverse environments, in which temperature varies across a wide range. As temperature affects a circuit delay greatly, accurate temperature monitors are required. They should be placed at various locations on a chip including hot spots. This paper proposes a flexible ring-oscillator-based monitor that accurately measures voltage as well as temperature at the same time. The measurement accuracy was confirmed by circuit simulation for 180 nm, 90 nm and 45 nm technologies. An experiment using test chips with 180 nm technology shows its feasibility. | |||||
| 言語 | en | |||||
| 備考 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 2014 IEEE 23rd Asian Test Symposium (ATS), 16-19 Nov. 2014, Hangzhou, China | |||||
| 書誌情報 |
en : 2014 IEEE 23rd Asian Test Symposium p. 156-161, 発行日 2014-12-11 |
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| 出版社 | ||||||
| 出版社 | IEEE | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/ATS.2014.38 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1081-7735 | |||||
| 著作権関連情報 | ||||||
| 権利情報 | Copyright (c) 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | temperature monitor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | voltage monitor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | ring oscillator | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | field test | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | delay test | |||||
| 出版タイプ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 査読の有無 | ||||||
| 値 | yes | |||||
| 研究者情報 | ||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | |||||
| 論文ID（連携） | ||||||
| 値 | 10282590 | |||||
| 連携ID | ||||||
| 値 | 6193 | |||||
