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{"_buckets": {"deposit": "c269f441-cc39-4a03-b5fb-64e7cd37a256"}, "_deposit": {"created_by": 3, "id": "6480", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "6480"}, "status": "published"}, "_oai": {"id": "oai:kyutech.repo.nii.ac.jp:00006480", "sets": ["20"]}, "author_link": ["16176", "27282", "27283", "27284"], "item_23_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We monitored the current imbalance in a SiC-MOSFET chip under unclamped inductive switching condition by using our printed circuit board Rogowski coils. The current imbalance varied significantly from sample to sample. The SiC-MOSFET with a larger current imbalance was destroyed with lower avalanche current than other samples. It is assumed that the chip was destroyed due to partial temperature rise accompanying current concentration from current distribution and thermal simulation. The result shows that the current monitoring system is effective for analysis of avalanche robustness.", "subitem_description_type": "Abstract"}]}, "item_23_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "14th International Seminar on Power Semiconductors, August 29-31, 2018, Prague, Czech", "subitem_description_type": "Other"}]}, "item_23_description_60": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "Conference Paper", "subitem_description_type": "Other"}]}, "item_23_rights_13": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "ISPS 2018"}]}, "item_23_select_59": {"attribute_name": "査読の有無", "attribute_value_mlt": [{"subitem_select_item": "no"}]}, "item_23_text_37": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "Kyushu Institute of Technology Kitakyushu, Japan"}, {"subitem_text_value": "Kyushu Institute of Technology Kitakyushu, Japan"}, {"subitem_text_value": "Kyushu Institute of Technology Kitakyushu, Japan"}, {"subitem_text_value": "Kyushu Institute of Technology Kitakyushu, Japan"}]}, "item_23_text_62": {"attribute_name": "連携ID", "attribute_value_mlt": [{"subitem_text_value": "8194"}]}, "item_23_version_type_58": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Arimoto, T."}], "nameIdentifiers": [{"nameIdentifier": "27282", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tsukuda, M."}], "nameIdentifiers": [{"nameIdentifier": "27283", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsuura, S."}], "nameIdentifiers": [{"nameIdentifier": "27284", "nameIdentifierScheme": "WEKO"}]}, {"creatorAffiliations": [{"affiliationNameIdentifiers": [], "affiliationNames": [{"affiliationName": "", "affiliationNameLang": "ja"}]}], "creatorNames": [{"creatorName": "Omura, Ichiro", "creatorNameLang": "en"}, {"creatorName": "大村, 一郎", "creatorNameLang": "ja"}, {"creatorName": "オオムラ, イチロウ", "creatorNameLang": "ja-Kana"}], "familyNames": [{"familyName": "Omura", "familyNameLang": "en"}, {"familyName": "大村", "familyNameLang": "ja"}, {"familyName": "オオムラ", "familyNameLang": "ja-Kana"}], "givenNames": [{"givenName": "Ichiro", "givenNameLang": "en"}, {"givenName": "一郎", "givenNameLang": "ja"}, {"givenName": "イチロウ", "givenNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "16176", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "10510670", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000010510670"}, {"nameIdentifier": "7003814580", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7003814580"}, {"nameIdentifier": "69", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/69_ja.html"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-04-03"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "nperc106.pdf", "filesize": [{"value": "654.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 654700.0, "url": {"label": "nperc106.pdf", "url": "https://kyutech.repo.nii.ac.jp/record/6480/files/nperc106.pdf"}, "version_id": "7982684c-f0d9-4636-8ba1-99a14e1e5ebe"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "SiC-MOSFET", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Current Imbalance", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Unclamped Inductive Switching (UIS)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Rogowski coil", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Printed Circuit Board (PCB)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Thermal simulation", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Current Imbalance Monitoring in SiC-MOSFET under Unclamped Inductive Switching by Tiny PCB Rogowski Coil", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Current Imbalance Monitoring in SiC-MOSFET under Unclamped Inductive Switching by Tiny PCB Rogowski Coil"}]}, "item_type_id": "23", "owner": "3", "path": ["20"], "permalink_uri": "http://hdl.handle.net/10228/00007690", "pubdate": {"attribute_name": "公開日", "attribute_value": "2020-04-03"}, "publish_date": "2020-04-03", "publish_status": "0", "recid": "6480", "relation": {}, "relation_version_is_last": true, "title": ["Current Imbalance Monitoring in SiC-MOSFET under Unclamped Inductive Switching by Tiny PCB Rogowski Coil"], "weko_shared_id": 3}
Current Imbalance Monitoring in SiC-MOSFET under Unclamped Inductive Switching by Tiny PCB Rogowski Coil
http://hdl.handle.net/10228/00007690
http://hdl.handle.net/10228/00007690353b7081-037c-41b1-9df3-4fc706e3f41e
名前 / ファイル | ライセンス | アクション |
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nperc106.pdf (654.7 kB)
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Item type | 会議発表論文 = Conference Paper(1) | |||||||||||
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公開日 | 2020-04-03 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
資源タイプ | conference paper | |||||||||||
タイトル | ||||||||||||
タイトル | Current Imbalance Monitoring in SiC-MOSFET under Unclamped Inductive Switching by Tiny PCB Rogowski Coil | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
Arimoto, T.
× Arimoto, T.× Tsukuda, M.× Matsuura, S.× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | We monitored the current imbalance in a SiC-MOSFET chip under unclamped inductive switching condition by using our printed circuit board Rogowski coils. The current imbalance varied significantly from sample to sample. The SiC-MOSFET with a larger current imbalance was destroyed with lower avalanche current than other samples. It is assumed that the chip was destroyed due to partial temperature rise accompanying current concentration from current distribution and thermal simulation. The result shows that the current monitoring system is effective for analysis of avalanche robustness. | |||||||||||
備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | 14th International Seminar on Power Semiconductors, August 29-31, 2018, Prague, Czech | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | ISPS 2018 | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | SiC-MOSFET | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Current Imbalance | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Unclamped Inductive Switching (UIS) | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Rogowski coil | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Printed Circuit Board (PCB) | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | Thermal simulation | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | no | |||||||||||
連携ID | ||||||||||||
8194 | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology Kitakyushu, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology Kitakyushu, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology Kitakyushu, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology Kitakyushu, Japan | ||||||||||||
資料タイプ | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | Conference Paper |