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Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
http://hdl.handle.net/10228/4565
http://hdl.handle.net/10228/4565f4862b4e-4ae4-4e03-95cc-ea2ff952c56e
| 名前 / ファイル | ライセンス | アクション |
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2010-02-25 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment | |||||||||||||
| 言語 | en | |||||||||||||
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| 言語 | eng | |||||||||||||
| 著者 |
Wu, Meng-Fan
× Wu, Meng-Fan× Huang, Jiun-Lang× 温, 暁青× 宮瀬, 紘平
WEKO
6567
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although X-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This paper solves this problem by proposing a novel integrated automatic test pattern generation scheme that efficiently and effectively performs compressible low-capture-power X -filling. Related theoretical principles are established, based on which the problem size is substantially reduced. The proposed scheme is validated by benchmark circuits, as well as an industry design in the embedded deterministic test environment. | |||||||||||||
| 書誌情報 |
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 巻 28, 号 11, p. 1767-1776, 発行日 2009-11 |
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| 出版者 | Institute of Electrical and Electronics Engineers | |||||||||||||
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| 関連タイプ | isIdenticalTo | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1109/TCAD.2009.2030440 | |||||||||||||
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| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 0278-0070 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) 2009 IEEE. Personal use of this material is permitted.However,permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, ore to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | VoR | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 業績ID | ||||||||||||||
| 値 | 99E4EE94B18A41E6492576D30007F8E5 | |||||||||||||