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  1. 学術雑誌論文
  2. 5 技術(工学)

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

http://hdl.handle.net/10228/4565
http://hdl.handle.net/10228/4565
f4862b4e-4ae4-4e03-95cc-ea2ff952c56e
名前 / ファイル ライセンス アクション
powerSuppiy.pdf powerSuppiy.pdf (797.0 kB)
アイテムタイプ 学術雑誌論文 = Journal Article(1)
公開日 2010-02-25
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
タイトル
タイトル Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
言語 en
言語
言語 eng
著者 Wu, Meng-Fan

× Wu, Meng-Fan

WEKO 13768

en Wu, Meng-Fan

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Huang, Jiun-Lang

× Huang, Jiun-Lang

WEKO 13769

en Huang, Jiun-Lang

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温, 暁青

× 温, 暁青

WEKO 1143
e-Rad 20250897
Scopus著者ID 7201738030
九工大研究者情報 300

en Wen, Xiaoqing

ja 温, 暁青


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宮瀬, 紘平

× 宮瀬, 紘平

WEKO 6567
e-Rad 30452824
Scopus著者ID 6507979281
九工大研究者情報 219

en Miyase, Kohei

ja 宮瀬, 紘平

ja-Kana ミヤセ, コウヘイ


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抄録
内容記述タイプ Abstract
内容記述 Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although X-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This paper solves this problem by proposing a novel integrated automatic test pattern generation scheme that efficiently and effectively performs compressible low-capture-power X -filling. Related theoretical principles are established, based on which the problem size is substantially reduced. The proposed scheme is validated by benchmark circuits, as well as an industry design in the embedded deterministic test environment.
書誌情報 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

巻 28, 号 11, p. 1767-1776, 発行日 2009-11
出版社
出版者 Institute of Electrical and Electronics Engineers
DOI
関連タイプ isIdenticalTo
識別子タイプ DOI
関連識別子 https://doi.org/10.1109/TCAD.2009.2030440
ISSN
収録物識別子タイプ PISSN
収録物識別子 0278-0070
著作権関連情報
権利情報 Copyright (c) 2009 IEEE. Personal use of this material is permitted.However,permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, ore to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
査読の有無
値 yes
業績ID
値 99E4EE94B18A41E6492576D30007F8E5
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